NBC12429FA ON Semiconductor, NBC12429FA Datasheet - Page 10

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NBC12429FA

Manufacturer Part Number
NBC12429FA
Description
IC CLK PLL SYNC 25-400MHZ 32LQFP
Manufacturer
ON Semiconductor
Type
PLL Clock Generatorr
Datasheet

Specifications of NBC12429FA

Pll
Yes
Input
Crystal
Output
PECL
Number Of Circuits
1
Ratio - Input:output
1:1
Differential - Input:output
No/Yes
Frequency - Max
400MHz
Divider/multiplier
Yes/No
Voltage - Supply
3.135 V ~ 5.25 V
Operating Temperature
0°C ~ 70°C
Mounting Type
Surface Mount
Package / Case
32-LQFP
Frequency-max
400MHz
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Other names
NBC12429FAOS

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S_CLOCK signal samples the information on the S_DATA
line and loads it into a 14 bit shift register. Note that the
P_LOAD signal must be HIGH for the serial load operation
to function. The Test register is loaded with the first three
bits, the N register with the next two, and the M register with
the final nine bits of the data stream on the S_DATA input.
For each register, the most significant bit is loaded first (T2,
N1, and M8). A pulse on the S_LOAD pin after the shift
register is fully loaded will transfer the divide values into the
counters. The HIGH to LOW transition on the S_LOAD
input will latch the new divide values into the counters.
Figures 5 and 6 illustrate the timing diagram for both a
parallel and a serial load of the device synthesizer.
powerup through the parallel interface, and then possibly
M[8:0] and N[1:0] are normally specified once at
http://onsemi.com
10
again through the serial interface. This approach allows the
application to come up at one frequency and then change or
fine−tune the clock as the ability to control the serial
interface becomes available.
internal nodes as determined by the T[2:0] bits in the serial
configuration stream. It is not configurable through the
parallel interface. The T2, T1, and T0 control bits are preset
to ‘000’ when P_LOAD is LOW so that the PECL F
outputs are as jitter−free as possible. Any active signal on the
TEST output pin will have detrimental affects on the jitter
of the PECL output pair. In normal operations, jitter
specifications are only guaranteed if the TEST output is
static. The serial configuration port can be used to select one
of the alternate functions for this pin.
The TEST output provides visibility for one of the several
OUT

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