AD5220BNZ10 Analog Devices Inc, AD5220BNZ10 Datasheet - Page 7

• Manufacturer Part Number: AD5220BNZ10
• Description: IC POT DGTL 10K 128POS 8-DIP
• Manufacturer: Analog Devices Inc

Specifications of AD5220BNZ10

• Taps: 128
• Resistance (ohms): 10K
• Number Of Circuits: 1
• Temperature Coefficient: 800 ppm/°C Typical
• Memory Type: Volatile
• Interface: Up/Down Counter
• Voltage - Supply: 2.7 V ~ 5.5 V
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Through Hole
• Package / Case: 8-DIP (0.300", 7.62mm)
• Resistance In Ohms: 10K
• End To End Resistance: 10kohm
• Track Taper: Linear
• No. Of Steps: 128
• Resistance Tolerance: ± 30%
• Supply Voltage Range: 2.7V To 5.5V
• Control Interface: 3 Wire, Serial
• No. Of Pots: Single
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

REV.
Figure 28. Resistor Position Nonlinearity Error (Rheostat
Operation; R-INL, R-DNL)
Figure 27. Potentiometer Divider Nonlinearity Error Test
Circuit (INL, DNL)
Figure 30. Power Supply Sensitivity Test Circuit (PSS,
PSRR)
V+
A
Figure 29. Wiper Resistance Test Circuit
~
V
MS2
V
DD
V
A
A
B
V+
W
NO CONNECT
A
B
DUT
W
A
DUT
B
A
B
DUT
V
W
W
W
V
I
W
V
MS1
MS
=
V
DD
V+ = V
V
PSRR (dB) = 20 LOG
PSS (%/%) = –––––––
V+ = V
1LSB = V+/128
/R
MS
NOMINAL
R
V
W
MS
I
W
DD
DD
= [V
± 10%
MS1
– V
V
V
MS
DD
MS2
%
%
(
]/I
–––––
W
V
V
MS
DD
)
–7–
Figure 32. Noninverting Programmable Gain Test Circuit
Figure 31. Inverting Programmable Gain Test Circuit
Figure 34. Incremental ON Resistance Test Circuit
Parametric Test Circuits–
Figure 33. Gain vs. Frequency Test Circuit
OFFSET
OFFSET
OFFSET
GND
GND
GND
DUT
B
V
IN
V
W
IN
~
2.5V
V
~
IN
A
DUT
I
SW
~
A
2.5V DC
DUT
2.5V
CODE = ØØ
R
DUT
B
SW
A
W
W
B
W
=
B
0.1V
OP279
I
OP42
SW
OP279
+15V
–15V
+5V
H
+5V
0 TO V
0.1V
DD
AD5220
V
V
OUT
OUT
V
OUT