AD5242BRZ100 Analog Devices Inc, AD5242BRZ100 Datasheet - Page 6

• Manufacturer Part Number: AD5242BRZ100
• Description: IC POT DGTL DUAL 256POS 16SOIC
• Manufacturer: Analog Devices Inc

Specifications of AD5242BRZ100

• Taps: 256
• Resistance (ohms): 100K
• Number Of Circuits: 2
• Temperature Coefficient: 30 ppm/°C Typical
• Memory Type: Volatile
• Interface: I²C, 2-Wire Serial
• Voltage - Supply: 2.7 V ~ 5.5 V, ±2.3 V ~ 2.7 V
• Operating Temperature: -40°C ~ 105°C
• Mounting Type: Surface Mount
• Package / Case: 16-SOIC (3.9mm Width)
• Resistance In Ohms: 100K
• End To End Resistance: 100kohm
• No. Of Steps: 256
• Resistance Tolerance: +50, -30%
• Supply Voltage Range: 2.7V To 5.5V, ± 2.3V To ± 2.7V
• Control Interface: I2C, Serial
• No. Of Pots: Dual
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• For Use With: EVAL-AD5242EBZ - BOARD EVALUATION FOR AD5242
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant

AD5241/AD5242
ABSOLUTE MAXIMUM RATINGS
T
Table 3.
Parameter
V
V
V
V
I
Digital Input Voltage to GND
Operating Temperature Range
Thermal Resistance θ
Maximum Junction Temperature (T
Package Power Dissipation
Storage Temperature Range
Lead Temperature
1
A
Maximum current increases at lower resistance and different packages.
DD
SS
DD
A
A
, I
R
R
R
, V
14-Lead SOIC
16-Lead SOIC
14-Lead TSSOP
16-Lead TSSOP
Vapor Phase, 60 sec
Infrared, 15 sec
= 25°C, unless otherwise noted.
B
AB
AB
AB
to GND
to GND
to V
, I
B
, V
= 10 kΩ in TSSOP-14
= 100 kΩ in TSSOP-14
= 1 MΩ in TSSOP-14
W
W
SS
to GND
JA
J
max)
Rating
−0.3 V to +7 V
0 V to −7 V
7 V
V
5.0 mA
1.5 mA
0.5 mA
0 V to V
−40°C to +105°C
158°C/W
73°C/W
206°C/W
180°C/W
150°C
P
−65°C to +150°C
215°C
220°C
SS
D
= (T
to V
J
1
1
DD
1
DD
max − T
+ 0.3 V
A
)/θ
Rev. C | Page 6 of 20
JA
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION