M38510/01701BFA QP SEMICONDUCTOR, M38510/01701BFA Datasheet

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M38510/01701BFA

Manufacturer Part Number
M38510/01701BFA
Description
Manufacturer
QP SEMICONDUCTOR
Datasheet

Specifications of M38510/01701BFA

Lead Free Status / Rohs Status
Supplier Unconfirmed
microcircuits. Three product assurance classes and a choice of case outlines/lead finish are provided for each type
and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been
superseded by MIL-PRF-38535, (see 6.4).
AMSC N/A
Comments, suggestions, or questions on this document should be addressed to: Commander, Defense
Supply Center Columbus, ATTN: DSCC-VAS, P. O. Box 3990, Columbus, OH 43218-3990, or emailed to
bipolar@dscc.dla.mil. Since contact information can change, you may want to verify the currency of this
address information using the ASSIST Online database at
1. SCOPE
1.1 Scope. This specification covers the detail requirements for monolithic silicon, TTL, bistable logic
1.2 Part or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herein.
1.2.1 Device types. The device types are as follows:
1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535.
The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF 38535
Device type
01
02
03
04
05
06
07
MICROCIRCUITS, DIGITAL, TTL, FLIP-FLOPS, MONOLITHIC SILICON
This specification is approved for use by all Departments
and Agencies of the Department of Defense.
Inactive for new design after 7 September 1995
Single J-K master-slave flip-flop
Dual J-K master-slave flip-flop, no preset
Dual J-K master-slave flip-flop, no preset
Dual J-K master-slave flip-flop
Dual D-type edge-triggered flip-flop
Dual D-type edge-triggered flip-flop, buffered output
Single edge-triggered J-K flip-flop
MILITARY SPECIFICATION
Circuit
http://assist.daps.dla.mil
MIL-M-38510/2G
8 February 2005
SUPERSEDING
MIL-M-38510/2E
24 December 1974
MIL-M-0038510/2F (USAF)
24 OCTOBER 1975
INCH-POUND
FSC 5962

Related parts for M38510/01701BFA

M38510/01701BFA Summary of contents

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MICROCIRCUITS, DIGITAL, TTL, FLIP-FLOPS, MONOLITHIC SILICON This specification is approved for use by all Departments The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF 38535 1. SCOPE 1.1 Scope. This specification covers the detail ...

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Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator A GDFP5-F14 or CDFP6-F14 B GDFP4-F14 C GDIP1-T14 or CDIP2-T14 D GDFP1-F14 or CDFP2-F14 E GDIP1-T16 or CDIP2-T16 F GDFP2-F16 or CDFP3-F16 ...

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Government documents. 2.2.1 Specifications and Standards. The following specifications and standards form a part of this specification to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT ...

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TABLE I Test High-level output voltage Low-level output voltage Input clamp voltage Low-level input current Low-level input current Low-level input current High-level input current High-level input current High-level input current High-level input current High-level input current High-level input current Short-circuit ...

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Input condition – Clear for device types 05 and 07. 9/ See table III for complete terminal conditions. 10/ Minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency. ...

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Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, and 6 shall be omitted. 4.4.2 Group ...

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MIL-M-38510/2G FIGURE 1. Logic diagram and terminal connections. 7 ...

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MIL-M-38510/2G FIGURE 1. Logic diagram and terminal connections – Continued. 8 ...

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MIL-M-38510/2G Device type 01 Truth table Positive logic: Low input to preset sets Q to high-level Low input to clear sets Q to low-level Preset and clear are ...

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MIL-M-38510/2G Device type 04 Truth table each flip-flop Positive logic: Low input to preset sets Q to high-level Low input to clear sets Q to low-level Preset and ...

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MIL-M-38510/2G Device type 06 Truth table Positive logic: Low input to preset sets Q to high-level Low input to clear sets Q to low-level Preset or clear function ...

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MIL-M-38510/2G FIGURE 3. Schematic circuits. 12 ...

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MIL-M-38510/2G FIGURE 3. Schematic circuits – Continued. 13 ...

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MIL-M-38510/2G FIGURE 3. Schematic circuits – Continued. 14 ...

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NOTES: 1. Circuits A, B, and C are the only acceptable variations for device types 02 and 03. 2. All resistance values shown are nominal. FIGURE 3. Schematic circuits – Continued. MIL-M-38510/2G 15 ...

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MIL-M-38510/2G FIGURE 3. Schematic circuits – Continued. 16 ...

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MIL-M-38510/2G FIGURE 3. Schematic circuits – Continued. 17 ...

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NOTES: 1. Circuits A, B and C are the only acceptable variation for device type 04. 2. All resistance values shown are nominal. FIGURE 3. Schematic circuits – Continued. MIL-M-38510/2G 18 ...

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NOTES: 1. Circuits A, B, and C are the only acceptable variations for device type 05. 2. All resistance values shown are nominal. FIGURE 3. Schematic circuits – Continued. MIL-M-38510/2G 19 ...

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MIL-M-38510/2G FIGURE 3. Schematic circuits – Continued. 20 ...

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NOTE: All resistance values shown are nominal. FIGURE 3. Schematic circuits – Continued. MIL-M-38510/2G 21 ...

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NOTES: 1. Circuits A and B are the only acceptable variations for device type 07. 2. All resistance values shown are nominal. FIGURE 3. Schematic circuits – Continued. MIL-M-38510/2G 22 ...

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NOTES: 1. Clear or preset inputs dominate regardless of the state of clock or J-K inputs. 2. Clear or preset input pulse characteristics (preset ns, PRR = 1 MHz, and ...

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NOTES: 1. Clock input characteristics for ns, and PRR = 1 MHz. All J and K inputs are at 2.4 V. When testing f input characteristics are gen III ...

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NOTES: 1. Clear inputs dominate regardless of the state of clock or J-K inputs. 2. Clear input pulse characteristics All diodes are 1N3064, or equivalent pF, minimum (C includes probe and jig capacitance). L ...

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NOTES: 1. Clock input characteristics for ns, and PRR = 1 MHz. All J and K inputs are at 2.4 V. When testing f input characteristics are gen subgroups 9, 10, and ...

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NOTES: 1. Clear or preset inputs dominate regardless of the state of clock or J-K inputs. 2. Clear or preset input pulse characteristics: V ≈ 50Ω. MHz, and Z OUT pF, minimum (including jig and probe ...

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NOTES: 1. Clock input characteristics for ns, and PRR = 1 MHz. All J and K inputs are at 2.4 V. When testing f input characteristics are gen III. 2. All diodes ...

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NOTES: 1. Clear and preset inputs dominate regardless of the state of clock or D inputs. 2. All diodes are 1N3064, or equivalent. 3. Clear or preset input pulse characteristics MHz pF, minimum (including ...

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NOTES: 1. Clock input pulse has the following characteristics: V ns, and PRR = 1 MHz. When testing input (pulse A ) has the following characteristics ns, and PRR is 50% of the ...

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FIGURE 12. Synchronous switching test circuit (low-level data) for device types 05 and 07. MIL-M-38510/2G 31 ...

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NOTES: 1. Clock input pulse has the following characteristics: V ns, and PRR = 1 MHz input (pulse A ) has the following characteristics ns, and PRR is 50% of the clock PRR. D ...

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NOTES: 1. Preset or clear function can occur only when clock input is low. Gated inputs are inhibited. 2. All diodes are 1N3064, or equivalent pF, minimum, including jig and probe capacitance Clear or ...

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NOTES: 1. Clock input pulse has the following characteristics: V PRR = 1 MHz. When testing f MAX 2. All diodes are 1N3064, or equivalent minimum including jig and probe capacitance 390Ω ±5% ...

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NOTES: 1. Apply normal clock pulse, then sink - the clock input. 2. The output Q is measured after - applied to the clock to insure it is still in the low state. FIGURE 15. Input ...

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Subgroup Symbol MIL- Case STD-883 Case method Test No. K1 Clock 3006 1 0 “ “ 25°C C “ “ ...

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Subgroup Symbol MIL- Case STD-883 Case method Test No. K1 Clock 1 I 3010 46 CKT A GND 2.4 V IH5 T = 25°C “ “ 46 CKT B “ “ C ...

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Subgroup Symbol MIL- Case STD-883 Case method Test No. K1 Clock 25° Same tests, terminal conditions and ...

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Subgroup Symbol MIL- Case STD-883 Case method Test No. Clock 1 Clear 3006 25°C “ “ “ “ “ 3 0.8 ...

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Subgroup Symbol MIL- Case STD-883 Case method Test No. Clock 1 Clear 3011 45 2.4 V GND 25°C C “ “ 3011 4.5 V ...

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Subgroup Symbol MIL- Case STD-883 Case method Test No. Clock 1 Clear (Fig MAX T = 25°C “ “ “ “ “ ...

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Subgroup Symbol MIL- Case STD-883 Case C 1 method Test No. Clock 1 Clear 3003 117 IN 5.0 V PHL2 T = 125°C C “ “ “ 118 IN 5.0 V “ “ ...

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Subgroup Symbol MIL- Case STD-883 Test No method 1 V 3006 1 2 25°C “ “ 2 0 “ “ “ 3 -.4 mA “ “ ...

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Subgroup Symbol MIL- Case STD-883 Test No method 1 I 3011 45 2.4 V GND OS “ 3011 * 46 4.5 V GND T = 25°C C “ “ 3011 * 47 “ “ 3011 ...

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Subgroup Symbol MIL- Case STD-883 Test No method (Fig 2.4 V MAX T = 25°C “ “ 90 2.4 V OUT C “ “ “ 91 “ “ “ ...

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NOTES Normal clock pulse Momentary GND, then 4 This note has been deleted Momentary 4.5 V, then GND Momentary ground, then 2 Momentary ground, then 5.5 ...

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Subgroup Symbol MIL- Case E & STD-883 Test No. Clock 1 Preset 1 method 1 V 3006 “ “ 25°C C “ “ “ 3 2.0 V “ “ “ ...

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Subgroup Symbol MIL- Case E & STD-883 Test No. Clock 1 Preset 1 Clear 1 method 1 I 3010 47 GND IH3 T = 25°C “ “ 48 GND E C “ “ “ 49 “ “ ...

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Subgroup Symbol MIL- Case E & STD-883 Test No. Clock 1 Preset 1 Clear 1 method 25° “ “ ...

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Subgroup Symbol MIL- Case E & STD-883 Test No. Clock 1 Preset 1 method 9 t 3003 122 IN 5.0 V PHL2 (Fig 25°C C “ “ “ 123 “ “ “ 124 10 ...

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NOTES Normal clock pulse Momentary GND, then 4 This note has been deleted Momentary ground, then 2 Momentary ground, then 5 Test time limit ≤ ...

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Subgroup Symbol MIL-STD- Case 883 Case method Test No. Clock 3006 25°C “ “ 0 “ “ ...

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Subgroup Symbol MIL-STD- Case 883 Case method Test No. Clock 3011 25°C “ “ “ “ “ 51 “ “ “ 52 ...

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Subgroup Symbol MIL- Case STD-883 Case method Test No. Clock 3003 89 PLH1 (Fig 10 25°C C “ “ “ 90 “ “ “ 91 “ ...

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See notes at end of device type 05. Subgroup Symbol MIL- Case STD-883 Case C method Test No. Clock 3003 5/ 117 IN IN (A) PLH2 T = 125°C (Fig 11) ...

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Subgroup Symbol MIL-STD- Case 883 Case method Test No. K1 Clock 1 V 3006 1 0 25°C “ “ “ “ “ ...

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Subgroup Symbol MIL-STD- Case 883 Case method Test No. K1 Clock 25°C C “ “ ...

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Subgroup Symbol MIL-STD- Case 883 Case C 10 method Test No. K1 Clock (Fig. 14) 93 2.4 V MAX F 5/ (Fig. 14 25°C MAX C “ t ...

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Subgroup Symbol MIL-STD- Case 883 Case method Test No. Clock 3006 25°C “ “ 0 “ “ ...

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Subgroup Symbol MIL-STD- Case 883 Case method Test No. Clock 3011 25°C “ “ “ “ “ 51 “ “ “ 52 ...

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Subgroup Symbol MIL-STD- Case 883 Case C 3 method Test No. Clock (Fig. 11 MAX T = 25°C “ “ “ “ “ 84 “ ...

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Subgroup Symbol MIL-STD- Case 883 Case method Test No. Clock (Fig. 11) 102 IN E MAX “ “ 103 125°C C “ “ ...

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PACKAGING 5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When packaging of materiel performed by DoD or in-house contractor personnel, these personnel need to ...

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Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-PRF-38535, MIL-HDBK-1331, and as follows: GND ............................................ Electrical ground (common terminal) V ............................................... Voltage level at an input terminal IN 6.6 Logistic support. Lead materials ...

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Custodians: Army - CR Navy - EC Air Force - 11 DLA - CC Review activities: Army – SM, MI Navy - AS, CG, MC Air Force – 03, 19, 99 NOTE: The activities listed above were interested ...

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