ADM1181AARWZ-REEL Analog Devices Inc, ADM1181AARWZ-REEL Datasheet - Page 4

• Manufacturer Part Number: ADM1181AARWZ-REEL
• Description: IC TXRX RS-232 5V 15KV 16SOIC
• Manufacturer: Analog Devices Inc
• Type: Transceiverr

Specifications of ADM1181AARWZ-REEL

• Number Of Drivers/receivers: 2/2
• Protocol: RS232
• Voltage - Supply: 4.5 V ~ 5.5 V
• Mounting Type: Surface Mount
• Package / Case: 16-SOIC (0.300", 7.5mm Width)
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

ADM202E/ADM1181A
ABSOLUTE MAXIMUM RATINGS
T
Table 2.
Parameter
V
V+
V–
Input Voltages
Output Voltages
Short-Circuit Duration
Power Dissipation N-16
Power Dissipation R-16
Power Dissipation RU-16
Operating Temperature Range
Storage Temperature Range
Lead Temperature (Soldering, 10 sec)
ESD Rating (MIL-STD-883B) (I/O Pins)
ESD Rating (IEC1000-4-2 Air) (I/O Pins)
ESD Rating (IEC1000-4-2 Contact)
EFT Rating (IEC1000-4-4) (I/O Pins)
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
CC
A
T
R
T
R
T
(Derate 6 mW/°C Above 50°C)
θ
(Derate 6 mW/°C Above 50°C)
θ
(Derate 6 mW/°C Above 50°C)
θ
Industrial (A Version)
(I/O Pins)
= 25°C, unless otherwise noted.
IN
OUT
OUT
IN
OUT
JA
JA
JA
, Thermal Impedance
, Thermal Impedance
, Thermal Impedance
Values
−0.3 V to +6 V
(V
+0.3 V to −14 V
0.3 V to (V+, +0.3 V)
±30 V
±15 V
–0.3 V to (V
Continuous
450 mW
117°C/W
450 mW
158°C/W
500 mW
158°C/W
–40°C to +85°C
–65°C to +150°C
300°C
±15 kV
±15 kV
±8 kV
±2 kV
CC
− 0.3 V) to +14 V
CC
+ 0.3 V)
Rev. C | Page 4 of 16
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods may
affect device reliability.