74F30D Philips Semiconductors, 74F30D Datasheet - Page 3

• Manufacturer Part Number: 74F30D
• Description: 8-BIT NAND GATE
• Manufacturer: Philips Semiconductors

Specifications of 74F30D

• Current, Supply: 0.6 mA (High), 2.8 mA (Low)
• Function Type: 8-Inputs
• Logic Function: NAND Gate
• Logic Type: TTL
• Package Type: SO-14
• Temperature, Operating, Range: 0 to +70 °C
• Voltage, Supply: 5 V
• Lead Free Status / Rohs Status: RoHS Compliant part Electrostatic Device

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
3. Not more than one output should be shorted at a time. For testing I
For all waveforms, V
Philips Semiconductors
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
NOTES:
AC ELECTRICAL CHARACTERISTICS
AC WAVEFORMS
NOTE:
SYMBOL
SYMBOL
V
V
V
V
V
I
I
I
I
I
I
I
IH
IL
OS
CC
CC
SYMBOL
t
t
O
OH
O
OL
IK
PLH
PHL
8-input NAND gate
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
High level output voltage
High-level output voltage
Low level output voltage
Low-level output voltage
Input clamp voltage
Input current at maximum input voltage
High-level input current
Low-level input current
Short-circuit output current
Supply current (total)
Supply current (total)
Propagation delay
Da, Db, Dc, Dd, De, Df, Dg, Dh to Q
M
= 1.5V.
PARAMETER
CC
PARAMETER
PARAMETER
= 5V, T
OS
Da, Db, Dc, Dd,
De, Df, Dg, Dh
tests should be performed last.
amb
3
Waveform 1. Propagation Delay for Inverting Outputs
= 25 C.
Q
I
I
CCH
CCL
CONDITION
CONDITION
Waveform 1
V
V
V
V
V
V
V
V
V
V
V
CC
IH
CC
IH
CC
CC
CC
CC
CC
CC
CC
V
TEST
TEST
M
t
= MIN, I
= MIN, I
PHL
= MIN, V
= MIN, V
= MIN, I
= MAX, V
= MAX, V
= MAX, V
= MAX
= MAX
= MAX
V
M
TEST CONDITIONS
TEST CONDITIONS
OS
4
OH
OL
I
, the use of high-speed test apparatus and/or sample-and-hold
IL
IL
V
= I
I
I
I
M
= MAX
= MAX
= 7.0V
= 2.7V
= 0.5V
= MAX
= MAX
IK
MIN
1.5
1.0
C
L
t
PLH
= 50pF, R
T
V
V
amb
M
CC
V
V
IN
IN
TYP
1
1
10%V
10%V
5%V
5%V
= +5.0V
3.5
3.0
= +25 C
= GND
= 4.5V
SF00074
L
CC
CC
= 500
CC
CC
MAX
5.0
4.5
LIMITS
MIN
–60
2.5
2.7
C
T
V
L
amb
MIN
LIMITS
CC
1.5
1.0
TYP
–0.73
= 50pF, R
0.30
0.30
3.4
0.6
2.8
= +5.0V
= 0 C to +70 C
2
L
MAX
–150
0.50
0.50
–1.2
–0.6
100
1.5
4.0
Product specification
20
= 500
MAX
5.5
5.0
10%
74F30
UNIT
UNIT
mA
mA
mA
mA
UNIT
V
V
V
V
V
A
A
ns