ADM206AR Analog Devices Inc, ADM206AR Datasheet - Page 4

• Manufacturer Part Number: ADM206AR
• Description: IC TXRX RS-232 5V SD/EN 24SOIC
• Manufacturer: Analog Devices Inc
• Type: Transceiverr

Specifications of ADM206AR

• Rohs Status: RoHS non-compliant
• Number Of Drivers/receivers: 4/4
• Protocol: RS232
• Voltage - Supply: 4.5 V ~ 5.5 V
• Mounting Type: Surface Mount
• Package / Case: 24-SOIC (7.5mm Width)

ADM206–ADM211/ADM213
ABSOLUTE MAXIMUM RATINGS
T
Table 3.
Parameter
V
V+
V–
Input Voltages
Output Voltages
Short-Circuit Duration
Power Dissipation
Thermal Impedance, θ
Operating Temperature Range
Storage Temperature Range
Lead Temperature, Soldering
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
CC
A
T
R
T
R
T
N-24 PDIP
R-24 SOIC
R-28 SOIC
RS-24 SSOP
RS-28 SSOP
Industrial (A Version)
Vapor Phase (60 s)
Infrared (15 s)
N-24 PDIP (Derate 13.5 mW/°C
R-24 SOIC (Derate 12 mW/°C
R-28 SOIC (Derate 12.5 mW/°C
RS-24 SSOP (Derate 12 mW/°C
RS-28 SSOP (Derate 10 mW/°C
= 25°C, unless otherwise noted.
IN
OUT
OUT
IN
OUT
above 70°C)
above 70°C)
above 70°C)
above 70°C)
above 70°C)
JA
Min
–0.3 V to +6 V
(V
+0.3 V to –14 V
–0.3 V to (V
±30 V
(V+, +0.3 V) to (V–, –0.3 V)
–0.3 V to (V
Continuous
1000 mW
850 mW
900 mW
850 mW
900 mW
120°C/W
85°C/W
80°C/W
115°C/W
100°C/W
–40°C to +85°C
–65°C to +150°C
300°C
215°C
220°
CC
– 0.3 V) to +14 V
CC
CC
+ 0.3 V)
+ 0.3 V)
Rev. C | Page 4 of 16
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods of
time may affect device reliability.