LH28F008SAT-12 Sharp Electronics, LH28F008SAT-12 Datasheet - Page 18

• Manufacturer Part Number: LH28F008SAT-12
• Manufacturer: Sharp Electronics

Specifications of LH28F008SAT-12

• Cell Type: NOR
• Density: 8Mb
• Access Time (max): 120ns
• Interface Type: Parallel
• Boot Type: Not Required
• Address Bus: 20b
• Operating Supply Voltage (typ): 5V
• Operating Temp Range: 0C to 70C
• Package Type: TSOP
• Program/erase Volt (typ): 11.4 to 12.6V
• Sync/async: Asynchronous
• Operating Temperature Classification: Commercial
• Operating Supply Voltage (min): 4.5V
• Operating Supply Voltage (max): 5.5V
• Word Size: 8b
• Number Of Words: 1M
• Supply Current: 50mA
• Mounting: Surface Mount
• Pin Count: 40
• Lead Free Status / Rohs Status: Not Compliant

LH28F008SA
AC INPUT/OUTPUT
REFERENCE WAVEFORM
NOTES:
1. Testing characteristics for LH28F008SA-85 in Standard
2. Testing characteristics for LH28F008SA-85 in
18
AC TESTING LOAD CIRCUIT
0.45
NOTE:
AC test inputs are driven at V
(0.45 V
and V
and fall times (10% to 90%) < 10 ns.
NOTE:
C
C
R
2.4
L
L
L
configuration, and LH28F008SA-12.
High Speed configuration
= 100 pF
Includes Jig Capacitance
= 3.3 k
INPUT
IL
TTL
(0.8 V
) for a Logic '0.' Input timing begins at V
TTL
DEVICE
UNDER
). Output timing ends at V
TEST
2.0
0.8
TEST POINTS
OH
1.3 V
(2.4 V
R
1N914
C
L
L
TTL
1
) for a Logic '1' and V
IH
1
OUT
and V
IH
IL
(2.0 V
2.0
0.8
. Input rise
28F008SA-10
OUTPUT
28F008SA-8
TTL
)
OL
HIGH SPEED AC INPUT/OUTPUT
REFERENCE WAVEFORM
HIGH SPEED AC TESTING LOAD CIRCUIT
NOTE:
AC test inputs are driven at 3.0 V for a Logic '1' and 0.0 V for a
Logic '0'. Input timing begins, and output timing ends at 1.5 V.
Input rise and fall times (10% to 90%) < 10 ns.
NOTE:
C
C
R
3.0
0.0
L
L
L
= 30 pF
Includes Jig Capacitance
= 3.3 k
INPUT
1.5
DEVICE
UNDER
TEST
TEST POINTS
8M (1M × 8) Flash Memory
1.3 V
R
1N914
C
L
L
2
OUT
1.5
OUTPUT
28F008SA-11
28F008SA-9
2