AD7280AWBSTZ Analog Devices Inc, AD7280AWBSTZ Datasheet - Page 14

• Manufacturer Part Number: AD7280AWBSTZ
• Description: IC BATT MON LI-ION AUTO 48LQFP
• Manufacturer: Analog Devices Inc
• Series: -r

Specifications of AD7280AWBSTZ

• Function: Battery Monitor, Over/Under Voltage Protection
• Battery Chemistry: Lithium-Ion (Li-Ion)
• Voltage - Supply: 8 V ~ 30 V
• Operating Temperature: -40°C ~ 105°C
• Mounting Type: Surface Mount
• Package / Case: 48-LQFP
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

AD7280A
TERMINOLOGY
Differential Nonlinearity (DNL)
DNL is the difference between the measured and the ideal
1 LSB change between any two adjacent codes in the ADC.
Integral Nonlinearity (INL)
INL is the maximum deviation from a straight line passing
through the endpoints of the ADC transfer function. The
endpoints of the transfer function are zero scale (a point 1 LSB
below the first code transition) and full scale (a point 1 LSB
above the last code transition).
Offset Error
Offset error applies to straight binary output coding. It is the
deviation of the first code transition (000 ... 000) to (000 ... 001)
from the ideal, that is, AGND + 1 LSB for AUX1 to AUX6 and
1 V + AGND + 1 LSB for VIN0 to VIN6.
Offset Error Match
Offset error match is the difference in zero code error across all
six channels.
Gain Error
Gain error applies to straight binary output coding. It is the
deviation of the last code transition (111 ... 110) to (111 ... 111)
from the ideal (that is, 2 × V
offset error.
Gain Error Match
Gain error match is the difference in gain error across all six
channels.
ADC Unadjusted Error
ADC unadjusted error includes the INL error and the offset and
gain errors of the ADC and measurement channel.
Total Unadjusted Error (TUE)
TUE is the maximum deviation of the output code from the ideal.
Total unadjusted error includes the INL error, the offset and gain
errors, and the reference errors. Reference errors include the
difference between the actual and ideal reference voltage (that
is, 2.5 V) and the reference voltage temperature coefficient.
Reference Voltage Temperature Coefficient
The reference voltage temperature coefficient is derived from
the maximum and minimum reference output voltage (V
measured between T
using the following equation:
where:
V
V
T
T
MAX
MIN
REF
REF
(Max) is the maximum V
(Min) is the minimum V
= −40°C.
TCV
= +85°C or +105°C.
REF
(ppm/
°
MIN
C)
and T
=
⎛
⎜
⎜
⎝
V
REF
REF
2
REF
REF
MAX
5 .
− 1 LSB) after adjusting for the
between T
V
between T
(
. It is expressed in ppm/°C
Max
×
(
T
)
MAX
−
V
MIN
MIN
REF
−
T
and T
(
and T
MIN
Min
)
)
MAX
MAX
⎞
⎟
⎟
⎠
×
.
.
10
REF
6
)
Rev. 0 | Page 14 of 48
Output Voltage Hysteresis
Output voltage hysteresis, or thermal hysteresis, is defined as
the absolute maximum change of reference output voltage after
the device is cycled through temperature from either T_HYS+
or T_HYS−, where:
Output voltage hysteresis is expressed in ppm using the follow-
ing equation:
where:
V
V
T_HYS−.
Static Leakage Current
Static leakage current is the current measured on the cell voltage
and/or the auxiliary ADC inputs when the device is static, that
is, not converting.
Dynamic Leakage Current
Dynamic leakage current is the current measured on the cell
voltage and/or the auxiliary ADC inputs when the device is
converting, with the static leakage current subtracted. Dynamic
leakage current is specified with a convert start pulse frequency
of 10 Hz, that is, every 100 ms. The dynamic leakage current for
a different conversion rate can be calculated using the following
equation:
where:
I
frequency, f
I
start frequency, f
DYN(A)
DYN(B)
REF
REF
(25°C) = V
(T_HYS) is the maximum change of V
T_HYS+ = +25°C to T
T_HYS− = +25°C to T
V
I
is the dynamic leakage current at the desired convert
is the dynamic leakage current at the convert start
DYN(B)
HYS
(ppm)
CNVST(A)
=
⎛
⎜
⎜
⎝
REF
I
=
CNVST(B)
DYN(A)
at 25°C.
(see Table 1).
⎛
⎜
⎜
⎝
V
f
REF
CNVST
.
×
(
25
f
CNVST
MAX
MIN
(
V
A
°
)
C)
REF
to +25°C
to +25°C
(
−
B
(
25
)
V
⎞
⎟
⎟
⎠
REF
°
C)
(
T_HYS
REF
at T_HYS+ or
)
⎞
⎟
⎟
⎠
×
10
6