DS21554LB+ Maxim Integrated Products, DS21554LB+ Datasheet - Page 96

• Manufacturer Part Number: DS21554LB+
• Description: IC TXRX E1 5V 100-LQFP
• Manufacturer: Maxim Integrated Products

Specifications of DS21554LB+

• Function: Single-Chip Transceiver
• Interface: E1, HDLC, J1, T1
• Number Of Circuits: 1
• Voltage - Supply: 4.75 V ~ 5.25 V
• Current - Supply: 75mA
• Operating Temperature: 0°C ~ 70°C
• Mounting Type: Surface Mount
• Package / Case: 100-LQFP
• Includes: Remote and AIS Alarm Detector / Generator
• Product: Framer
• Number Of Transceivers: 1
• Data Rate: 1.544 Mbps
• Supply Voltage (max): 5.25 V
• Supply Voltage (min): 4.75 V
• Supply Current (max): 75 mA (Typ)
• Maximum Operating Temperature: + 70 C
• Minimum Operating Temperature: 0 C
• Mounting Style: SMD/SMT
• Ic Interface Type: Parallel, Serial
• Supply Voltage Range: 4.75V To 5.25V
• Operating Temperature Range: 0°C To +70°C
• Digital Ic Case Style: LQFP
• No. Of Pins: 100
• Filter Terminals: SMD
• Rohs Compliant: Yes
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Power (watts): -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

rising edge of JTCLK following entry into the Capture-DR state. Shift-DR can be used to shift the
identification code out serially via JTDO. During Test-Logic-Reset, the identification code is forced into
the instruction register’s parallel output. The ID code will always have a one in the LSB position. The
next 11 bits identify the manufacturer’s JEDEC number and number of continuation bytes followed by 16
bits for the device and 4 bits for the version. See
SCT devices.
Table 16-2. ID Code Structure
MSB
Version
Contact Factory
4 bits
Table 16-3. Device ID Codes
16.2.
IEEE 1149.1 requires a minimum of two test registers; the bypass register and the boundary scan register.
An optional test register has been included with the DS21354/554 design. This test register is the
identification register and is used in conjunction with the IDCODE instruction and the Test-Logic-Reset
state of the TAP controller.
Boundary Scan Register
This register contains both a shift register path and a latched parallel output for all control cells and
digital I/O cells and is n bits in length. See
Bypass Register
This is a single one-bit shift register used in conjunction with the BYPASS, CLAMP, and HIGHZ
instructions that provides a short path between JTDI and JTDO.
Identification Register
The identification register contains a 32-bit shift register and a 32-bit latched parallel output. This register
is selected during the IDCODE instruction and when the TAP controller is in the Test-Logic-Reset state.
See
Table 16-3
Test Registers
DEVICE
DS21354
DS21554
DS21352
DS21552
and
Table 16-4
for more information on bit usage.
Device ID
16 bits
16-BIT ID
0005h
0003h
0004h
0002h
Table 16-4
96 of 124
Table
for all the cell bit locations and definitions.
16-2.
00010100001
JEDEC
Table 16-3
lists the device ID codes for the
LSB
1
1