SI3220-BQ Silicon Laboratories Inc, SI3220-BQ Datasheet - Page 85

• Manufacturer Part Number: SI3220-BQ
• Description: IC SLIC/CODEC DUAL-CH 64TQFP
• Manufacturer: Silicon Laboratories Inc
• Series: ProSLIC®r

Specifications of SI3220-BQ

• Package / Case: *
• Function: Subscriber Line Interface Concept (SLIC), CODEC
• Interface: GCI, PCM, SPI
• Number Of Circuits: 2
• Voltage - Supply: 3.3V, 5V
• Current - Supply: 65mA
• Power (watts): 941mW
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Includes: Battery Switching, BORSCHT Functions, DTMF Generation and Decoding, FSK Tone Generation, Modem and Fax Tone Detection
• Product: Telecom
• Supply Voltage (min): 3.13 V
• Supply Current: 22 mA
• Maximum Operating Temperature: + 85 C
• Minimum Operating Temperature: - 40 C
• Mounting Style: SMD/SMT
• Number Of Channels: 2
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

System Testing
The Dual ProSLIC devices include a complete suite of
test tools to test the functionality of the line card and
detect fault conditions present on the TIP/RING pair.
Using one of the loopback test modes with the signal
generation and measurement tools eliminates the need
for per-line test relays and centralized test equipment.
Loopback Modes
Three loopback test options are available for the Dual
ProSLIC devices:
!
!
!
The codec loopback path encompasses almost
entirely the electronics of both the transmit and
receive paths. The analog signal at the output of the
receive path is fed back to the input of the transmit
path through a feedback path on the analog side of
the audio codec. Both the impedance synthesis and
transhybrid balance functions are disabled in this
mode. (See DLM3 path in Figure 11 on page 22.)
The signal path starts with 8-bit PCM data input to
the receive path and ends with 8-bit PCM data at the
output of the transmit path. The user can bypass the
companding process and interface directly to the 16-
bit data.
A second digital loopback takes the receive path
digital stream and routes it back to the transmit path
via the transhybrid feedback path. (See DLM2 path
through block H in Figure 11.) This mode
characterizes the transhybrid filter response. The
transhybrid block also can be disabled (set to unity
gain) in this mode for diagnosing the digital gain
blocks and filter stages in both transmit and receive
paths. The signal path starts with 8-bit PCM data
input to the receive path and ends with 8-bit PCM
data at the output of the transmit path. The user can
bypass the companding process and interface
directly to the 16-bit data.
A third digital loopback takes the digital stream at the
output of the µ-Law/A-Law expander and feeds it
back to the input of the µ-Law/A-Law compressor.
(See DLM1 path in Figure 11.) This path verifies that
the host is connected correctly with the Dual
ProSLIC through the PCM interface and that the
PCLK and FSYNC signals are correctly set. This
mode also can test the µ-Law/A-Law companding
process. The signal path starts with 8-bit PCM data
input to the receive path and ends with 8-bit PCM
data at the output of the transmit path. The user can
also connect directly to the 16-bit data to eliminate
the µ-Law/A-Law companding process when testing
the PCM interface.
Preliminary Rev. 0.91
Line Test and Diagnostics
The Dual ProSLIC devices provide a variety of signal
generation and measurement tools that facilitate fault
detection and parametric diagnostics on the TIP/RING
pair and line card functionality verification. The Dual
ProSLIC
appropriate voltage/current/signal levels, and processes
the results to provide a meaningful result to the user.
Interaction is required from the host microprocessor to
load the test parameters into the appropriate registers,
initiate the test(s), and read the results from the
registers. In some cases, the host processor might also
be required to perform some simple mathematics to
achieve the results. Software modules are available to
simplify integration of the diagnostics functions into the
system. The need for test relays and a separate test
head is eliminated in most applications. To address
legacy applications, all versions of the Dual proSLIC
include test-in and test-out relay drivers to switch in a
centralized test head.
The
capabilities are categorized into three sections: signal
generation tools, measurement tools, and diagnostics
capabilities.
measurement tools, a variety of other diagnostics
functions can also be performed to meet the unique
requirements
summarizes the ranges and capabilities of the signal
generation and measurement tools.
Dual
generates
ProSLIC’s
Using
of
specific
these
Si3220/Si3225
test
line
signals,
signal
applications.
test
and
generation
measures
diagnostics
Table 47
and
the
85