LH28F016SCR-L12 Sharp, LH28F016SCR-L12 Datasheet

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LH28F016SCR-L12

Manufacturer Part Number
LH28F016SCR-L12
Description
16M-bit(2MB x 8)smart voltage Flash Memory
Manufacturer
Sharp
Datasheet
DESCRIPTION
The LH28F016SC-L/SCH-L flash memories with
SmartVoltage technology are high-density, low-cost,
nonvolatile, read/write storage solution for a wide
range of applications. Their symmetrically-blocked
architecture, flexible voltage and enhanced cycling
capability provide for highly flexible component
suitable for resident flash arrays, SIMMs and
memory
capabilities provide for an ideal solution for code +
data storage applications. For secure code storage
applications, such as networking, where code is
either directly executed out of flash or downloaded
to DRAM, the LH28F016SC-L/SCH-L offer three
levels of protection : absolute protection with Vpp at
GND, selective hardware block locking, or flexible
software block locking. These alternatives give
designers ultimate control of their code security
needs.
FEATURES
• SmartVoltage technology
• High performance read access time
COMPARISON TABLE
LH28F016SC-L/SCH-L
In the absence of confirmation by device specification sheets, SHARP takes no responsibility for any defects that may occur in equipment using any SHARP devices shown in catalogs, data books,
etc. Contact SHARP in order to obtain the latest device specification sheets before using any SHARP device.
LH28F016SC-L
LH28F016SCH-L
– 2.7 V (Read-only), 3.3 V or 5 V V
– 3.3 V, 5 V or 12 V V
LH28F016SC-L95/SCH-L95
– 95 ns (5.0±0.25 V)/100 ns (5.0±0.5 V)/
LH28F016SC-L12/SCH-L12
– 120 ns (5.0±0.5 V)/150 ns (3.3±0.3 V)/
VERSIONS
120 ns (3.3±0.3 V)/150 ns (2.7 to 3.6 V)
170 ns (2.7 to 3.6 V)
cards.
Their
TEMPERATURE
OPERATING
–40 to +85˚C
0 to +70˚C
PP
enhanced
CC
V
suspend
CC
deep power-down current (MAX.)
DC CHARACTERISTICS
- 1 -
10 µA
20 µA
• Enhanced automated suspend options
• Enhanced data protection features
• SRAM-compatible write interface
• High-density symmetrically-blocked architecture
• Enhanced cycling capability
• Low power management
• Automated byte write and block erase
• ETOX
• Packages
ETOX is a trademark of Intel Corporation.
– Byte write suspend to read
– Block erase suspend to byte write
– Block erase suspend to read
– Absolute protection with V
– Flexible block locking
– Block erase/byte write lockout during power
– Thirty-two 64 k-byte erasable blocks
– 100 000 block erase cycles
– 3.2 million block erase cycles/chip
– Deep power-down mode
– Automatic power saving mode decreases I
– Command user interface
– Status register
– 40-pin TSOP Type I (TSOP040-P-1020)
– 44-pin SOP (SOP044-P-0600)
– 48-ball CSP (FBGA048-P-0810)
16 M-bit (2 MB x 8) SmartVoltage
transitions
in static mode
TM
V nonvolatile flash technology
40-pin TSOP (I), 44-pin SOP,
48-ball CSP
40-pin TSOP (I), 48-ball CSP
Normal bend/Reverse bend
LH28F016SC-L/SCH-L
PACKAGE
Flash Memories
[LH28F016SC-L]
PP
= GND
CC

Related parts for LH28F016SCR-L12

LH28F016SCR-L12 Summary of contents

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... In the absence of confirmation by device specification sheets, SHARP takes no responsibility for any defects that may occur in equipment using any SHARP devices shown in catalogs, data books, etc. Contact SHARP in order to obtain the latest device specification sheets before using any SHARP device. ...

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PIN CONNECTIONS 40-PIN TSOP (Type CE RP# 12 ...

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BLOCK DIAGRAM Y DECODER INPUT BUFFER ADDRESS LATCH X DECODER ADDRESS COUNTER DQ - OUTPUT INPUT BUFFER BUFFER IDENTIFIER REGISTER STATUS REGISTER DATA COMPARATOR Y GATING 32 64 k-BYTE BLOCKS - 3 - LH28F016SC-L/SCH-L ...

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PIN DESCRIPTION SYMBOL TYPE ADDRESS INPUTS : Inputs for addresses during read and write operations. Addresses A -A INPUT 0 20 are internally latched during a write cycle. DATA INPUT/OUTPUTS : Inputs data and commands during CUI write cycles; outputs ...

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INTRODUCTION This datasheet contains LH28F016SC-L/SCH-L specifications. Section 1 provides a flash memory overview. Sections and 5 describe the memory organization and functionality. Section 6 covers electrical specifications. LH28F016SC-L/ SCH-L flash memories documentation also includes ordering information ...

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independent of other blocks. Each block PP can be independently erased 100 000 times (3.2 million block erases per device). Block erase suspend mode allows system software to suspend block erase to read data from, or ...

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Block 1F0000 1EFFFF 64 k-Byte Block 1E0000 1DFFFF 64 k-Byte Block 1D0000 1CFFFF 64 k-Byte Block 1C0000 1BFFFF 64 k-Byte Block 1B0000 1AFFFF 64 k-Byte Block 1A0000 19FFFF 64 k-Byte Block 190000 18FFFF 64 k-Byte Block 180000 ...

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Byte write suspend allows system software to suspend a byte write to read data from any other flash memory array location. 2.1 Data ...

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... CPU initialization may not occur because the flash memory may be providing status information instead of array data. SHARP’s flash memories allow proper CPU initialization following a system reset through the use of the RP# input. In this application, RP# is controlled by the same RESET# signal that resets the system CPU ...

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Write Writing commands to the CUI enable reading of device data and identifier codes. They also control inspection and clearing of the status register. When the CUI additionally controls PP PPH1/2/3 block erasure, byte write, ...

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... The clear block lock-bits operation simultaneously clears all block lock-bits. If the master lock-bit is not set, the Clear Block Lock-Bits command can be done while RP Commands other than those shown above are reserved by SHARP for future device implementations and should not be used. to enable ...

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Read Array Command Upon initial device power-up and after exit from deep power-down mode, the device defaults to read array mode. This operation is also initiated by writing the Read Array command. The device remains enabled for reads until ...

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Fig. 3). The CPU can detect block erase completion by analyzing the output data of the RY/BY# pin or status register bit SR.7. When the block erase is complete, status ...

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Write Suspend command (see Section 4.8), a byte write operation can also be suspended. During a byte write operation with block erase suspended, status register bit SR.7 will return to “0” and the RY/BY# output will transition to V SR.6 ...

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When the set lock-bit operation is complete, status register bit SR.4 should be checked error is detected, the status register should be cleared. The CUI will remain in read status register mode until a new command is issued. ...

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MASTER BLOCK OPERATION LOCK-BIT LOCK-BIT 0 Block Erase X or Byte Write Set Block Lock-Bit 1 X Set Master X X Lock-Bit 0 X Clear Block Lock-Bits 1 X WSMS ESS ECLBS SR.7 = ...

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Start Write 20H, Block Address Write D0H, Block Address Read Status Register Suspend Block No Erase Loop 0 Suspend SR.7 = Block Erase Yes 1 Full Status Check if Desired Block Erase Complete FULL STATUS CHECK PROCEDURE Read Status Register ...

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Start Write 40H, Address Write Byte Data and Address Read Status Register Suspend Byte No Write Loop 0 Suspend SR.7 = Byte Write Yes 1 Full Status Check if Desired Byte Write Complete FULL STATUS CHECK PROCEDURE Read Status Register ...

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Start Write B0H Read Status Register 0 SR Block Erase SR.6 = Completed 1 Read Read Byte Write or Byte Write? Read Array Data Byte Write Loop No Done? Yes Write D0H Write FFH Block Erase Resumed ...

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Start Write B0H Read Status Register 0 SR Byte Write SR.2 = Completed 1 Write FFH Read Array Data No Done Reading Yes Write D0H Write FFH Read Byte Write Resumed Array Data Fig. 6 Byte Write ...

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Start Write 60H, Block/Device Address Write 01H/F1H, Block/Device Address Read Status Register 0 SR Full Status Check if Desired Set Lock-Bit Complete FULL STATUS CHECK PROCEDURE Read Status Register Data (See Above Range Error ...

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Start Write 60H Write D0H Read Status Register 0 SR Full Status Check if Desired Clear Block Lock-Bits Complete FULL STATUS CHECK PROCEDURE Read Status Register Data (See Above Range Error ...

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... DESIGN CONSIDERATIONS 5.1 Three-Line Output Control The device will often be used in large memory arrays. SHARP provides three control inputs to accommodate multiple memory connections. Three-line control provides for : a. Lowest possible memory power consumption. b. Complete assurance that data bus contention will not occur. To use these control inputs efficiently, an address decoder should enable CE# while OE# should be connected to all memory devices and the system’ ...

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Device power-off or RP# transitions to V clear the status register. IL The CUI latches commands issued by system software and is not altered by V transitions or WSM actions. Its state is read array mode upon ...

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... Test condition : Ambient temperature 2. Block erase, byte write and lock-bit configuration operations with V NOTICE : The specifications are subject to change without notice. Verify with your local SHARP sales office that you have the latest datasheet before finalizing a design. WARNING : Stressing the device beyond the Absolute ...

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CAPACITANCE SYMBOL PARAMETER C Input Capacitance IN C Output Capacitance OUT NOTE : 1. Sampled, not 100% tested. 6.2.2 AC INPUT/OUTPUT TEST CONDITIONS 2.7 INPUT 0.0 AC test inputs are driven at 2.7 V for a Logic ...

Page 27

V 1N914 DEVICE UNDER TEST Includes Jig L Capacitance Fig. 12 Transient Equivalent Testing Load Circuit Test Configuration Capacitance Loading Value TEST CONFIGURATION V = 3.3±0.3 V, 2.7 to 3.6 V ...

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DC CHARACTERISTICS SYMBOL PARAMETER NOTE I Input Load Current LI I Output Leakage Current Standby Current CCS CC LH28F016 V Deep Power- SC CCD Down Current LH28F016 SCH Read ...

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DC CHARACTERISTICS (contd.) SYMBOL PARAMETER NOTE Input Low Voltage Input High Voltage IH V Output Low Voltage Output High Voltage OH1 (TTL) Output High Voltage OH2 (CMOS) ...

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AC CHARACTERISTICS - READ-ONLY OPERATIONS V = 2 +70 • VERSIONS SYMBOL PARAMETER t Read Cycle Time AVAV t Address to Output Delay AVQV t CE# to Output Delay ELQV ...

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AC CHARACTERISTICS - READ-ONLY OPERATIONS (contd.) • 5.0±0.25 V, 5.0±0 VERSIONS SYMBOL PARAMETER t Read Cycle Time AVAV t Address to Output Delay AVQV t CE# to Output Delay ELQV t RP# High ...

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Standby V IH ADDRESSES ( CE# ( OE# ( WE# ( High Z DATA (D/Q) ( ...

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AC CHARACTERISTICS - WRITE OPERATION V = 2 +70 • VERSIONS SYMBOL PARAMETER t Write Cycle Time AVAV t RP# High Recovery to WE# Going Low PHWL t CE# Setup ...

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AC CHARACTERISTICS - WRITE OPERATION (contd.) • 5.0±0.25 V, 5.0±0 VERSIONS SYMBOL PARAMETER t Write Cycle Time AVAV RP# High Recovery to WE# t PHWL Going Low t CE# Setup to WE# Going ...

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V IH ADDRESSES ( CE# ( ELWL V IH OE# ( WE# ( High DATA (D/Q) t PHWL V IL ...

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ALTERNATIVE CE#-CONTROLLED WRITES • 2 +70˚C or – VERSIONS SYMBOL PARAMETER t Write Cycle Time AVAV t RP# High Recovery to CE# Going Low PHEL t ...

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ALTERNATIVE CE#-CONTROLLED WRITES (contd.) • 5.0±0.25 V, 5.0±0 VERSIONS SYMBOL PARAMETER t Write Cycle Time AVAV RP# High Recovery to CE# t PHEL Going Low t WE# Setup to CE# Going Low WLEL ...

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V IH ADDRESSES ( AVAV V IH WE# ( WLEL V IH OE# ( CE# ( High DATA (D/Q) t ...

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RESET OPERATIONS V OH RY/BY# ( RP# ( RY/BY# ( RP# ( 2.7 V/3.3 V RP# (P) V ...

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BLOCK ERASE, BYTE WRITE AND LOCK-BIT CONFIGURATION PERFORMANCE • 3.3±0 +70˚C or – SYMBOL PARAMETER NOTE t WHQV1 Byte Write Time t EHQV1 Block Write Time t WHQV2 ...

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... ORDERING INFORMATION Product line designator for all SHARP Flash products ( Device Density 016 = 16 M-bit Architecture S = Symmetrical Block Power Supply Type C = SmartVoltage Technology Operating Temperature Blank = – + OPTION ORDER CODE 1 ...

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TSOP (TSOP040-P-1020 0.3 20.0 0.2 18.4 0.3 19.0 PACKAGING Package base plane ...

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SOP (SOP044-P-0600 0.4 0 0.1 0.15 M 1.27 TYP 0.2 28.2 PACKAGING 0.15 0.05 Package base plane ...

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CSP (FBGA048-P-0810 0.1 S 3.0 0.8 0 0.1 S TYP. 0.4 + 0.2 10 TYP. TYP. TYP 0.03 0. PACKAGING Land ...

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