SAM7S321 Atmel Corporation, SAM7S321 Datasheet - Page 238

• Manufacturer Part Number: SAM7S321
• Manufacturer: Atmel Corporation

Specifications of SAM7S321

• Flash (kbytes): 32 Kbytes
• Pin Count: 64
• Max. Operating Frequency: 55 MHz
• Cpu: ARM7TDMI
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 32
• Ext Interrupts: 32
• Usb Transceiver: 1
• Usb Speed: Full Speed
• Usb Interface: Device
• Spi: 1
• Twi (i2c): 1
• Uart: 3
• Ssc: 1
• Graphic Lcd: No
• Video Decoder: No
• Camera Interface: No
• Adc Channels: 8
• Adc Resolution (bits): 10
• Adc Speed (ksps): 384
• Resistive Touch Screen: No
• Temp. Sensor: No
• Crypto Engine: No
• Sram (kbytes): 8
• Self Program Memory: NO
• Dram Memory: No
• Nand Interface: No
• Picopower: No
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 1.8/3.3
• Operating Voltage (vcc): 3.0 to 3.6
• Fpu: No
• Mpu / Mmu: no / no
• Timers: 3
• Output Compare Channels: 3
• Input Capture Channels: 3
• Pwm Channels: 4
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: No

Debug in Depth
B-20
To access this serial register, scan chain 2 must first be selected using the SCAN_N TAP
controller instruction. The TAP controller must then be placed in INTEST mode.
•
•
•
Scan chain 3
Purpose
Length
Scan chain 3 control signals are provided so that an optional external boundary-scan
chain can be controlled through the ARM7TDMI core. Typically, this is used for a scan
chain around the pad ring of a packaged device.
The following control signals are provided which are generated only when scan chain
3 has been selected. These outputs are inactive at all other times:
DRIVEBS
PCLKBS
ICAPCLKBS, ECAPCLKBS
SHCLKBS, SHCLK2BS
During CAPTURE-DR, no action is taken.
During SHIFT-DR, a data value is shifted into the serial register. Bits 32 to 36
specify the address of the EmbeddedICE Logic register to be accessed.
During UPDATE-DR, this register is either read or written depending on the value
of bit 37, with 0=read).
Copyright © 1994-2001. All rights reserved.
Enables the ARM7TDMI core to control an external boundary-scan
chain.
User defined.
This is used to switch the scan cells from system mode to test mode. This
signal is asserted whenever either the INTEST, EXTEST, CLAMP, or
CLAMPZ instruction is selected.
This is an update clock, generated in the UPDATE-DR state. Typically
the value scanned into a chain is transferred to the cell output on the rising
edge of this signal.
These are capture clocks used to sample data into the scan cells during
INTEST and EXTEST respectively. These clocks are generated in the
CAPTURE-DR state.
These are non-overlapping clocks generated in the SHIFT-DR state used
to clock the master and slave element of the scan cells respectively. When
the state machine is not in the SHIFT-DR state, both these clocks are
LOW.
ARM DDI 0029G