CM28C010-120 Maxwell Technologies, Inc., CM28C010-120 Datasheet

no-image

CM28C010-120

Manufacturer Part Number
CM28C010-120
Description
Microcircuit Memory Digital CMOS 128k x 8-Bit EEPROM Monolithic Silicon
Manufacturer
Maxwell Technologies, Inc.
Datasheet
1.CM28C010-120.pdf (40 pages)
DSCC FORM 2233
DEPARTMENT OF DEFENSE
APR 97
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
AND AGENCIES OF THE
LTR
C
D
G
A
B
E
F
MICROCIRCUIT
THIS DRAWING IS
FOR USE BY ALL
AMSC N/A
DEPARTMENTS
STANDARD
DRAWING
AVAILABLE
Add packages T and W. Add vendor CAGE 60395 as source of
supply. Increase data retention to 20 years, minimum. Redrawn with
changes.
Changes in accordance with NOR 5962-R139-94.
Changes in accordance with NOR 5962-R278-94.
Changes in accordance with NOR 5962-R163-96.
Updated boilerplate. Added device types 16-18 and packages M and N
to drawing along with vendor CAGE 0EU86 as supplier. Removed
figures 9, 10 and 11 software data protect algorithms. Removed
vendor 61395 as supplier. - glg
Corrected dimensions for packages "M" and "N". - glg
Added device 19, packages 6 and 7, and updated boilerplate. ksr
35
15
G
G
36
16
G
G
37
17
G
G
THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED.
PREPARED BY
Kenneth Rice
CHECKED BY
Charles Reusing
APPROVED BY
Charles E. Besore
DRAWING APPROVAL DATE
REVISION LEVEL
18
G
REV
SHEET
19
G
91-07-12
DESCRIPTION
20
G
G
21
G
G
1
22
G
G
2
REVISIONS
23
G
G
3
MICROCIRCUIT, MEMORY, DIGITAL,
CMOS 128K x 8 BIT EEPROM,
MONOLITHIC SILICON
SIZE
24
SHEET
G
G
4
A
DEFENSE SUPPLY CENTER COLUMBUS
25
G
G
5
1
CAGE CODE
26
G
G
COLUMBUS, OHIO 43216
6
67268
OF
27
G
G
7
DATE
93-06-29
94-03-29
94-09-19
96-06-27
98-07-22
99-10-06
01- 10- 05
28
G
G
37
8
(YR-MO-DA)
29
G
G
9
5962-38267
30
10
G
G
31
11
G
G
M. A. Frye
M. A. Frye
M. A. Frye
M. A. Frye
Raymond Monnin
Raymond Monnin
Raymond Monnin
APPROVED
32
12
G
G
5962-E561-01
33
13
G
G
34
14
G
G

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CM28C010-120 Summary of contents

Page 1

LTR A Add packages T and W. Add vendor CAGE 60395 as source of supply. Increase data retention to 20 years, minimum. Redrawn with changes. B Changes in accordance with NOR 5962-R139-94. C Changes in accordance with NOR 5962-R278-94. D ...

Page 2

SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected ...

Page 3

Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows: Outline letter See figure 1(enhanced rad tolerant) 7 See figure 1(enhanced rad tolerant) 1.2.5 Lead finish. ...

Page 4

APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue ...

Page 5

REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the ...

Page 6

Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made available onshore at the ...

Page 7

QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL- PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the ...

Page 8

Test |Symbol | | | | | High level input current | Low level input current | High impedance output |I OZH leakage current OZL | ...

Page 9

TABLE I. Electrical performance characteristics - Continued. | Test |Symbol | | | | | Input capacitance Output capacitance OUT | | | Functional tests | | | | | ...

Page 10

TABLE I. Electrical performance characteristics - Continued. | Test |Symbol | | | | OE to output in low Z |t OLQX Output disable to output |t OHQZ in high Output ...

Page 11

TABLE I. Electrical performance characteristics - Continued. | Test |Symbol | | | | Data hold time |t WHDX |t EHDX | | Byte load cycle |t WHWL2 | | | | | Last byte loaded to data |t WHEL ...

Page 12

TABLE I. Electrical performance characteristics - Continued. | Test |Symbol | | | | low to output float |t DFR | | | output delay |t RR ...

Page 13

Group A inspection. a. Tests shall be as specified in table IIA herein. b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 4 (C and C IN OUT changes which may ...

Page 14

STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 Case T FIGURE 1. Case outline. SIZE A REVISION LEVEL 5962-38267 SHEET G 14 ...

Page 15

STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 Case W FIGURE 1. Case outline - Continued. SIZE A 5962-38267 REVISION LEVEL SHEET G 15 ...

Page 16

STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 Case Z FIGURE 1. Case outline - Continued. SIZE A 5962-38267 REVISION LEVEL SHEET G 16 ...

Page 17

NOTES: 1. All dimensions and tolerances conform to ANSI Y14.5M-1982. 2. Index area: An identification mark shall be located adjacent to pin 1 within the shaded area shown. Alternatively, a tab (dim k) may be used as shown. 3. Dimension ...

Page 18

STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 Case M Pin 1 indicator FIGURE 1. Case outline - Continued. SIZE A 5962-38267 REVISION LEVEL SHEET G 18 ...

Page 19

Symbol NOTE: Although dimensions are in inches, the US government preferred system of measurement is the metric SI system. However, since this item was originally designed using inch-pound units of measurement, in the event of conflict between the two, the ...

Page 20

STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 Case N Pin 1 indicator FIGURE 1. Case outline - Continued. SIZE A 5962-38267 REVISION LEVEL SHEET G 20 ...

Page 21

Symbol NOTE: Although dimensions are in inches, the US government preferred system of measurement is the metric SI system. However, since this item was originally designed using inch-pound units of measurement, in the event of conflict between the two, the ...

Page 22

STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 Case 6 FIGURE 1. Case outline - Continued. SIZE A 5962-38267 REVISION LEVEL SHEET G 22 ...

Page 23

Symbol NOTE: Although dimensions are in inches, the US government preferred system of measurement is the metric SI system. However, since this item was originally designed using inch-pound units of measurement, in the event of conflict between the two, the ...

Page 24

STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 Case 7 FIGURE 1. Case outline - Continued. SIZE A 5962-38267 REVISION LEVEL SHEET G 24 ...

Page 25

Symbol NOTE: Although dimensions are in inches, the US government preferred system of measurement is the metric SI system. However, since this item was originally designed using inch-pound units of measurement, in the event of conflict between the two, the ...

Page 26

Device types Case outlines Terminal number A16 3 A15 4 A12 I/O0 14 I/O1 15 I/O2 16 ...

Page 27

Write inhibit Write inhibit Write inhibit Write inhibit Software chip clear Software write protect High voltage chip clear V = High logic, "1" state logic "don't care" state, High Z = high impedance state ...

Page 28

NOTE waveform is applicable to device types 16-19 only. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 READ MODE WAVEFORM FIGURE 4. Waveforms. SIZE A REVISION LEVEL ...

Page 29

NOTE: RDY and V CC STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 WE CONTROLLED BYTE WRITE WAVEFORMS ...

Page 30

NOTE: RDY and V CC STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 CE CONTROLLED BYTE WRITE WAVEFORMS ...

Page 31

NOTE: RDY and V CC STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 PAGE WRITE MODE CYCLE WAVEFORMS ...

Page 32

STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 CHIP ERASE WAVEFORMS (device types 01-15 only) FIGURE 4. Waveforms - continued. SIZE A 5962-38267 REVISION LEVEL SHEET G 32 ...

Page 33

NOTES and V will be adjusted to meet load conditions of table Use this circuit or equivalent circuit. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 FIGURE ...

Page 34

TABLE IIA. Electrical test requirements Line no. 1 Interim electrical parameters (see 4.2) 2 Static burn-in I method 1015 3 Same as line 1 4 Dynamic burn-in (method 1015) 5 Same as line ...

Page 35

Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). RHA levels for device classes M, Q, and V shall be as specified in MIL-PRF-38535. a. End-point ...

Page 36

Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military ...

Page 37

Waveforms. 6.6 Sources of supply. 6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535. The vendors listed in QML-38535 have submitted a certificate of compliance ...

Page 38

... AT28C010-25BM/883 | | 3/ | X28C010DMB- CM28C010-250 | | 1FN41 | AT28C010-25LM/883 | | 3/ | LM28C010-250 | | 1FN41 | AT28C010-25FM/883 | | 3/ | X28C010FMB- FM28C010-250 | | | | | 1FN41 | AT28C010-25UM/883 | | | | | | | | 1FN41 | AT28C010-25EM/883 | | | | | X28C010KMB- TM28C010-250 | | | | | 3/ | CM28C010H-250 | | | | | | | | 3/ | LM28C010H-250 | | | | | | | | 3/ | FM28C010H-250 | | | | | | | | TM28C010H-250 | | | | | 1FN41 | AT28C010-20BM/883 | | 3/ | X28C010DMB- CM28C010-200 | | 1FN41 | AT28C010-20LM/883 | | 3/ | LM28C010-200 | | 1FN41 | AT28C010-20FM/883 | | 3/ | X28C010FMB- FM28C010-200 | | | | | 1FN41 | AT28C010-20UM/883 | | | | | | | | 1FN41 | AT28C010-20EM/883 | | | | | X28C010KMB- TM28C010-200 | | | | | 3/ | CM28C010H-200 | | | | | | | | 3/ | LM28C010H-200 | | | | ...

Page 39

... AT28C010-15BM/883 | | 60395 | X28C010DMB- CM28C010-150 | | 1FN41 | AT28C010-15LM/883 | | 3/ | LM28C010-150 | | 1FN41 | AT28C010-15FM/883 | | 3/ | X28C010FMB- FM28C010-150 | | | | | 1FN41 | AT28C010-15UM/883 | | | | | | | | 1FN41 | AT28C010-15EM/883 | | | | | X28C010KMB- TM28C010-150 | | | | | 3/ | CM28C010H-150 | | | | | | | | 3/ | LM28C010H-150 | | | | | | | | 3/ | FM28C010H-150 | | | | | | | | TM28C010H-150 | | | | | 1FN41 | AT28C010-12BM/883 | | 60395 | X28C010DMB- CM28C010-120 | | | | | 1FN41 | AT28C010-12LM/883 | | 3/ | LM28C010-120 | | | | | | | | 1FN41 | AT28C010-15UM/883 | | | | | | | | 1FN41 | AT28C010-15EM/883 | | | | | | | | 1FN41 | AT28C010-12FM/883 | | 3/ | X28C010FMB- FM28C010-120 | | | | | X28C010KMB- TM28C010-120 | | | | ...

Page 40

STANDARD MICROCIRCUIT DRAWING SOURCE APPROVAL BULLETIN - Continued Standard | microcircuit drawing | CAGE | PIN 5962-3826716QUA | 5962-3826716QMA | 5962-3826716QMC | 5962-3826716QNA | 5962-3826716Q6C | 5962-3826716Q7C | | | 5962-3826717QUA | 5962-3826717QMA | ...

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