LT1128 Linear Technology Corporation, LT1128 Datasheet - Page 11

• Manufacturer Part Number: LT1128
• Description: Ultra Low Noise Precision High Speed Op Amps
• Manufacturer: Linear Technology Corporation

Noise Testing – Voltage Noise
The LT1028/LT1128’s RMS voltage noise density can be
accurately measured using the Quan Tech Noise Analyzer,
Model 5173 or an equivalent noise tester. Care should be
taken, however, to subtract the noise of the source resistor
used. Prefabricated test cards for the Model 5173 set the
device under test in a closed-loop gain of 31 with a 60
source resistor and a 1.8k feedback resistor. The noise of
this resistor combination is 0.13 58 = 1.0nV/ Hz. An
LT1028/LT1128 with 0.85nV/ Hz noise will read (0.85
1.0
should be replaced with a 10 source and 300 feedback
resistor. Even a 10 resistor will show an apparent noise
which is 8% to 10% too high.
The 0.1Hz to 10Hz peak-to-peak noise of the LT1028/
LT1128 is measured in the test circuit shown. The fre-
quency response of this noise tester indicates that the
0.1Hz corner is defined by only one zero. The test time to
measure 0.1Hz to 10Hz noise should not exceed 10
seconds, as this time limit acts as an additional zero to
eliminate noise contributions from the frequency band
below 0.1Hz.
A
* DEVICE UNDER TEST
VOLTAGE GAIN = 50,000
NOTE ALL CAPACITOR VALUES ARE FOR
NONPOLARIZED CAPACITORS ONLY
PPLICATI
10
2
)
1/2
= 1.31nV/ Hz. For better resolution, the resistors
–
+
0.1 F
*
100k
O
U
0.1Hz to 10Hz Noise Test Circuit
4.7 F
S
2k
I FOR ATIO
U
24.3k
+
–
LT1001
W
100k
0.1 F
2.2 F
U
4.3k
– OISE
U
2
22 F
+
110k
Measuring the typical 35nV peak-to-peak noise perfor-
mance of the LT1028/LT1128 requires special test pre-
cautions:
(a) The device should be warmed up for at least five
(b) For similar reasons, the device must be well shielded
(c) Sudden motion in the vicinity of the device can also
A noise-voltage density test is recommended when mea-
suring noise on a large number of units. A 10Hz noise-
voltage density measurement will correlate well with a
0.1Hz to 10Hz peak-to-peak noise reading since both
results are determined by the white noise and the location
of the 1/f corner frequency.
1028/1128 AI02
SCOPE
R
IN
1
minutes. As the op amp warms up, its offset voltage
changes typically 10 V due to its chip temperature
increasing 30 C to 40 C from the moment the power
supplies are turned on. In the 10 second measure-
ment interval these temperature-induced effects can
easily exceed tens of nanovolts.
from air current to eliminate the possibility of thermo-
electric effects in excess of a few nanovolts, which
would invalidate the measurements.
“feedthrough” to increase the observed noise.
= 1M
100
90
80
70
60
50
40
30
0.01
0.1Hz to 10Hz Peak-to-Peak Noise
Tester Frequency Response
0.1
FREQUENCY (Hz)
LT1028/LT1128
1.0
10
LT1028/1128 • AI03
11
100