ACS30D Intersil Corporation, ACS30D Datasheet
ACS30D
Manufacturer Part Number
ACS30D
Description
Radiation Hardened 8-input NAND Gate
Manufacturer
Intersil Corporation
Datasheet
1.ACS30D.pdf
(2 pages)
Radiation Hardened 8-Input NAND Gate
The Radiation Hardened ACS30MS is an 8-Input NAND
Gate. A HIGH level on all inputs results in a LOW level on
the Y output. A LOW level on any input results in a HIGH
level on the Y output. All inputs are buffered and the
outputs are designed for balanced propagation delay and
transition times.
The ACS30MS is fabricated on a CMOS Silicon on
Sapphire (SOS) process, which provides an immunity to
Single Event Latch-up and the capability of highly reliable
performance in any radiation environment. These devices
offer significant power reduction and faster performance
when compared to ALSTTL types.
Specifications for Rad Hard QML devices are controlled
by the Defense Supply Center in Columbus (DSCC). The
SMD numbers listed below must be used when ordering.
Detailed Electrical Specifications for the ACS30MS are
contained in SMD 5962-98631. A “hot-link” is provided
on our homepage for downloading.
http://www.intersil.com/spacedefense/spaceselect.htm
Ordering Information
Pinouts
5962F9863101VCC
ACS21D/SAMPLE-03
5962F9863101VXC
ACS21K/SAMPLE-03
5962F9863101V9A
ORDERING NUMBER
GND
A
B
C
D
E
F
1
2
3
4
5
6
7
TOP VIEW
ACS30MS
(SBDIP)
1
ACS30DMSR-03
ACS30D/SAMPLE-03
ACS30KMSR-03
ACS30K/SAMPLE-03
ACS30HMSR-03
INTERNAL MARKETING
Data Sheet
14
13
12
11
10
9
8
V
NC
H
G
NC
NC
Y
CC
NUMBER
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
TEMP. RANGE (
Features
• QML Qualified Per MIL-PRF-38535 Requirements
• 1.25 Micron Radiation Hardened SOS CMOS
• Radiation Environment
• Input Logic Levels. . . . V
• Output Current
• Quiescent Supply Current . . . . . . . . . . . . . . . 5.0 A (Max)
• Propagation Delay . . . . . . . . . . . . . . . . . . . . . . 16ns (Max)
Applications
• High Speed Control Circuits
• Sensor Monitoring
• Low Power Designs
-55 to 125
-55 to 125
- Latch-Up Free Under Any Conditions
- Total Dose (Max.) . . . . . . . . . . . . . . . . . 3 x 10
- SEU Immunity . . . . . . . . . . . . . <1 x 10
- SEU LET Threshold . . . . . . . . . . . . >100MeV/(mg/cm
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
GND
25
25
25
A
B
C
D
E
F
o
C)
July 1999
14 Ld SBDIP
14 Ld SBDIP
14 Ld Flatpack
14 Ld Flatpack
Die
(FLATPACK)
1
2
3
4
5
6
7
PACKAGE
TOP VIEW
ACS30MS
IL
= (0.3)(V
File Number
14
13
12
11
10
9
8
CC
ACS30MS
), V
-10
CDIP2-T14
CDIP2-T14
CDFP3-F14
CDFP3-F14
NA
DESIGNATOR
IH
Errors/Bit/Day
= (0.7)(V
12mA (Min)
5
RAD(Si)
V
NC
H
G
NC
NC
Y
4759
CC
CC
2
)
)
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