KSH13009L SemiHow, KSH13009L Datasheet - Page 7

no-image

KSH13009L

Manufacturer Part Number
KSH13009L
Description
Switch Mode series NPN silicon Power Transistor
Manufacturer
SemiHow
Datasheet
www.DataSheet.in
Reliability Qualification
D. High Temperature Storage Life ( HTSL )
E. Temperature Cycle Air-to Air ( TMCL )
The purpose of this test is to expose time/temperature failure mechanisms and to evaluate
The purpose of this test is to evaluate the ability of the device to withstand both exposure to
Conditions: JESD22-A103, JIS C 7021 B-10
T
Conditions: JESD22-A104, JIS C 7021 A-4
Air to air, -65℃~150℃, 15 minutes dwell time at each temperature
long-term strong stability.
extreme temperature and the transition between temperature extreme, and to exposure excessive
thermal mismatch between materials.
A
=T
stg
(max)
Sample Size
Sample Size
45
45
( Continued )
#of Fail
#of Fail
0
0
Cum. Fail%
Cum. Fail%
0.0%
0.0%
168hrs
100cycles
0
0
300hrs
0
200cycles
0
◎ SEMIHOW REV.A0,May 2003

Related parts for KSH13009L