TS8388BMFSB/QNB1 Atmel Corporation, TS8388BMFSB/QNB1 Datasheet - Page 10

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TS8388BMFSB/QNB1

Manufacturer Part Number
TS8388BMFSB/QNB1
Description
ADC 8-bit 1 GSPS
Manufacturer
Atmel Corporation
Datasheet
Explanation of
Test Levels
Functions
Description
Table 5. Functions Description
10
Name
V
V
V
GND
V
CLK, CLKB
<D0:D7>
<D0B:D7B>
DR, DRB
OR, ORB
GAIN
GORB
DIOD/DRRB
CC
EE
PLUSD
IN
, V
INB
TS8388BF
Function
Positive power supply
Analog negative power supply
Digital positive power supply
Ground
Differential analog inputs
Differential clock inputs
Differential output data port
Differential data ready outputs
Out of range outputs
ADC gain adjust
Gray or Binary digital output select
Die junction temperature measurement/
asynchronous data ready reset
Table 4. Explanation of Test Levels
Notes:
Num
1
2
3
4
5
6
1. Unless otherwise specified, all tests are pulsed tests: therefore Tj = Tc = Ta, where Tj, Tc
2. Refer to “Ordering Information” on page 43.
3. Only MIN and MAX values are guaranteed (typical values are issuing from characterization
and Ta are junction, case and ambient temperature respectively.
results).
Characteristics
100% production tested at +25 C
100% production tested at +25 C
(for “V” and “M” Temperature range
Sample tested only at specified temperatures.
Parameter is guaranteed by design and characterization testing (thermal steady-state
conditions at specified temperature).
Parameter is a typical value only.
100% production tested over specified temperature range
(for “B/Q” Temperature range
(2)
GORG
DRRB
DIOD/
CLKB
GAIN
VINB
).
CLK
VIN
DVEE = -5V
(1)
(1)
, and sample tested at specified temperatures
(2)
VCC = +5V
(for “C” Temperature range
).
VEE = -5V
TS8388BF
VPLUSD = +2.4V (LVDS)
VPLUSD = +0V (ECL)
GND
(2)
).
16
OR
ORB
D0
D0B
DR
DRB
2144A–BDC–04/02
D7
D7B

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