AD5170 Analog Devices, AD5170 Datasheet - Page 11

• Manufacturer Part Number: AD5170
• Description: 256-Position Two-Time Programmable I2C Digital Potentiometer
• Manufacturer: Analog Devices

TEST CIRCUITS
Figure 24 to Figure 29 illustrate the test circuits that define the
test conditions used in the product specification tables.
Figure 24. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL)
V
Figure 25. Test Circuit for Resistor Position Nonlinearity Error
MS2
Figure 26. Test Circuit for Wiper Resistance
V+
NO CONNECT
(Rheostat Operation; R-INL, R-DNL)
A
B
DUT
W
A W
B
A
B
DUT
DUT
W
V
W
V
MS1
I
W
= V
R
V+ = V
1LSB = V+/2
V
DD
W
MS
V
= [V
MS
/R
I
NOMINAL
W
DD
MS1
– V
N
MS2
]/I
W
Rev. 0 | Page 11 of 24
Figure 27. Test Circuit for Power Supply Sensitivity (PSS, PSSR)
OFFSET
Figure 29. Test Circuit for Common-Mode Leakage Current
V+
GND
∆V
V
Figure 28. Test Circuit for Gain vs. Frequency
DD
DD
V
IN
V
A
A
B
2.5V
GND
DUT
DUT
W
NC
NC
A
B
A
B
W
NC = NO CONNECT
DUT
W
V
MS
V+ = V
PSRR (dB) = 20 LOG
PSS (%/%) =
I
CM
AD8610
DD
+15V
–15V
± 10%
∆V
∆V
MS
DD
V
CM
%
%
(
V
∆V
∆V
OUT
AD5170
MS
DD
)