74hct1g00 NXP Semiconductors, 74hct1g00 Datasheet - Page 4

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74hct1g00

Manufacturer Part Number
74hct1g00
Description
2-input Nand Gate
Manufacturer
NXP Semiconductors
Datasheet

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RECOMMENDED OPERATING CONDITIONS
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 60134); voltages are referenced to GND (ground = 0 V);
see note 1 and 2.
Notes
1. Stresses beyond those listed may cause permanent damage to the device. These are stress rating only and
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
3. Above 55 C the value of P
2002 May 15
V
V
V
T
t
V
I
I
I
I
T
P
SYMBOL
SYMBOL
r
IK
OK
O
CC
,t
amb
stg
CC
I
O
CC
D
2-input NAND gate
f
functional operation of the device at these or any other conditions beyond those under ‘recommended operating
conditions’ is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device
reliability.
supply voltage
input voltage
output voltage
operating ambient
temperature
input rise and fall times V
supply voltage
input diode current
output diode current
output source or sink current
V
storage temperature
power dissipation per package
CC
or GND current
PARAMETER
PARAMETER
D
derates linearly with 2.5 mW/K.
see DC and AC
characteristics per
device
V
V
CC
CC
CC
CONDITIONS
= 2.0 V
= 4.5 V
= 6.0 V
V
V
for temperature range from 40 to +125 C;
note 3
0.5 V
I
O
0.5 V or V
0.5 V or V
V
O
4
2.0
0
0
V
MIN.
40
I
CONDITIONS
CC
O
V
+ 0.5 V
CC
V
74HC1G
CC
5.0
+25
TYP.
+ 0.5 V
+ 0.5 V
6.0
V
V
+125
1000
500
400
MAX.
74HC1G00; 74HCT1G00
CC
CC
4.5
0
0
MIN.
40
74HCT1G
+25
5.0
TYP.
MIN.
0.5
65
Product specification
5.5
V
V
+125
500
+7.0
+150
200
MAX.
MAX.
20
20
12.5
25
CC
CC
V
V
V
ns
ns
ns
V
mA
mA
mA
mA
mW
UNIT
UNIT
C
C

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