nl27wz126 ON Semiconductor, nl27wz126 Datasheet - Page 2

• Manufacturer Part Number: nl27wz126
• Description: Dual Buffer With 3-state Outputs
• Manufacturer: ON Semiconductor

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2−ounce copper trace with no air flow.
2. Tested to EIA/JESD22−A114−A.
3. Tested to EIA/JESD22−A115−A.
4. Tested to JESD22−C101−A.
5. Unused inputs may not be left open. All inputs must be tied to a high− or low−logic input voltage level.
RECOMMENDED OPERATING CONDITIONS
MAXIMUM RATINGS
V
V
V
I
I
I
I
I
T
T
T
q
P
MSL
F
V
Symbol
Symbol
IK
OK
O
CC
GND
JA
STG
L
J
R
Dt/DV
CC
I
O
D
ESD
V
V
T
V
CC
O
A
I
Supply Voltage
Input Voltage
Output Voltage
Operating Free−Air Temperature
Input Transition Rise or Fall Rate
DC Supply Voltage
DC Input Voltage
DC Output Voltage
DC Input Diode Current
DC Output Diode Current
DC Output Sink Current
DC Supply Current per Supply Pin
DC Ground Current per Ground Pin
Storage Temperature Range
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature under Bias
Thermal Resistance (Note 1)
Power Dissipation in Still Air at 85°C
Moisture Sensitivity
Flammability Rating
ESD Withstand Voltage
Parameter
Parameter
http://onsemi.com
NL27WZ126
Charged Device Model (Note 4)
Human Body Model (Note 2)
2
Machine Model (Note 3)
Oxygen Index: 28 to 34
(HIGH or LOW State)
Data Retention Only
V
V
V
CC
CC
CC
= 2.5 V $0.2 V
= 3.0 V $0.3 V
= 5.0 V $0.5 V
V
Operating
V
O
I
(Note 5)
< GND
< GND
UL 94 V−0 @ 0.125 in
*40
1.65
Min
1.5
0
0
0
0
0
*0.5 to )7.0
*0.5 to )7.0
*0.5 to )7.0
*65 to )150
Level 1
> 2000
Value
$100
$100
)150
> 200
*50
*50
$50
260
250
250
N/A
)85
Max
5.5
5.5
5.5
5.5
20
10
5
°C/W
ns/V
Unit
Unit
mW
mA
mA
mA
mA
mA
°C
°C
°C
°C
V
V
V
V
V
V
V