auirg7ch80k6b-m International Rectifier Corp., auirg7ch80k6b-m Datasheet

no-image

auirg7ch80k6b-m

Manufacturer Part Number
auirg7ch80k6b-m
Description
Automotive Grade
Manufacturer
International Rectifier Corp.
Datasheet

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
AUIRG7CH80K6B-M
Manufacturer:
IR
Quantity:
12 500
Features
Note:
*
**
www.irf.com
Benefits
Die Size
Emiter Pad Size (Included Gate Pad)
Gate Pad Size
Area Total / Active
Thickness
Wafer Size
Flat Position
Maximum-Possible Chips per Wafer
Passivation Frontside
Front Metal
Backside Metal
Die Bond
Reject Ink Dot Size
Recommended Storage Environment
Mechanical Parameter
This IR product is 100% tested at wafer level and is manufactured using established, mature and well characterized processes. Due to
restrictions in die level processing, die may not be equivalent to standard package products and are therefore offered with a conditional
performance guarantee. The above data sheet is based on IR sample testing under certain predetermined and assumed conditions,
and are provided for illustration purposes only. Customers are encouraged to perform testing in actual proposed package and use
conditions. IR die products are tested using IR-based quality assurance procedures and are manufactured using IR’s established
processes. Programs for customer-specified testing are available upon request. IR has experienced assembly yields of generally 95%
or greater for individual die; however, customer’s results will vary. Estimates such as those described and set forth in this data sheet for
semiconductor die will vary depending on a number of packaging, handling, use and other factors. Sold die may not perform on an
equivalent basis to standard package products and are therefore offered with a limited warranty as described in IR’s applicable standard
terms and conditions of sale. All IR die sales are subject to IR’s applicable standard terms and conditions of sale, which are available
upon request. For customers requiring a particular parameter to be guaranteed, special testing can be carried out or product can
bepurchased as known good die.
Technology qualified in sup-TO247 package according to AEC-Q101.
100% Tested at Probe
Designed for Automotive Application
Solderable Front Metal
Low V
Low Switching Losses
Maximum Junction Temperature 175 °C
Short Circuit Rated
Square RBSOA
Positive V
Tight Parameter Distribution
High Efficiency in a Wide Range of Applications
Suitable for a Wide Range of Switching Frequencies
due to Low V
Rugged Transient Performance for Increased
Reliability
Excellent Current Sharing in Parallel Operation
Enables Double side cooling and higher current density
Eliminates wire bonds and Improves Reliability
AUIRG7CH80K6B
Chip Type
CE (on)
CE (on)
Trench IGBT Technology
CE (on)
Temperature Coefficient
and Low Switching Losses
*
1200V
VCE
**
AUTOMOTIVE GRADE
200A
ICn
Applications
Medium/High Power Inverters
HEV/EV Inverter
AUIRG7CH80K6B-M
12 X 12 mm2
Al (0.1µm), Ti (0.1µm), Ni (0.4µm), Ag (0.6µm)
<6 months at an ambient temperature of 23°C
Die Size
Al (4µm), Ti (0.1µm), Ni (0.2µm), Ag (0.6µm)
Store in original container, in dry Nitrogen,
Electrically conductive epoxy or solder
Round, 1mm diameter
See Die Drawing
0.51mm min (black, center)
12.075x12.075
G
144/114
n-channel
140
150
Silicon Nitride
0
89 pcs
C
E
Package
Wafer
Degrees
mm2
01/12/10
mm
µm
1

Related parts for auirg7ch80k6b-m

auirg7ch80k6b-m Summary of contents

Page 1

... All IR die sales are subject to IR’s applicable standard terms and conditions of sale, which are available upon request. For customers requiring a particular parameter to be guaranteed, special testing can be carried out or product can bepurchased as known good die. ** Technology qualified in sup-TO247 package according to AEC-Q101. www.irf.com AUTOMOTIVE GRADE AUIRG7CH80K6B-M ** Applications • Medium/High Power Inverters • HEV/EV Inverter ...

Page 2

... AUIRG7CH80K6B-M Maximum Ratings Parameter V Collector-Emitter Voltage Collector Current, Limited by T C(Nominal) I Clamped Inductive Load Current LM V Gate Emitter Voltage Operating Junction and Storage Temperature J STG Static Characteristics (Tested on wafers Parameter V Collector-to-Emitter Breakdown Voltage (BR)CES V Collector-to-Emitter Saturation Voltage ...

Page 3

... For further information please contact your local IR Sales office or email your enquiry to http://die.irf.com IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 www.irf.com AUIRG7CH80K6B-M Data and specifications subject to change without notice. Qualification Standards can be found on IR’s Web site. TAC Fax: (310) 252-7903 Visit us at www ...

Related keywords