as29lv800b-90ti Anadigics, Inc., as29lv800b-90ti Datasheet - Page 22

• Manufacturer Part Number: as29lv800b-90ti
• Description: 1m 8/512k 16 Cmos Flash Eeprom
• Manufacturer: Anadigics, Inc.

AC test conditions
Test specifications
Erase and programming performance
* Erase/program cycle test is not verified on each shipped unit.
Latchup tolerance
Includes all pins except V
March 2001
Test Condition
Output Load
Output Load Capacitance C
Input Rise and Fall Times
Input Pulse Levels
Input timing measurement reference levels
Output timing measurement reference levels
Parameter
Sector erase and verify-1 time (excludes 00h programming
prior to erase)
Programming time
Chip programming time
Erase/program cycles
Parameter
Input voltage with respect to
Input voltage with respect to
Current
3/22/01; V.1.0
CC
. Test conditions: V
*
L
Device under test
(including jig capacitance)
V
V
SS
SS
on all DQ, address, and control pins
on A9,
CC
= 3.0V, one pin at a time.
OE, and RESET pin
Alliance Semiconductor
C
L
*
V
SS
6.2K
1N3064
or equivalent
Word
Byte
V
®
SS
V
SS
+3.0V
Min
2.7K
-
-
-
-
-
1N3064
or equivalent
-70R,-80
30
100,000
Min
-1.0
-0.5
-100
Typical
Limits
1.0
7.2
10
15
0.0-3.0
1.5
1.5
5
1 TTL gate
-90, -120
100
+12.0
Max
VCC
+100
Max
300
360
15
27
-
+0.5
AS29LV800
P. 22 of 25
Unit
Unit
V
V
mA
pF
ns
V
V
V
cycles
Unit
sec
sec
µs
µs