em78p164n ELAN Microelectronics Corp, em78p164n Datasheet - Page 67

• Manufacturer Part Number: em78p164n
• Description: 8-bit Microcontroller With Otp Rom
• Manufacturer: ELAN Microelectronics Corp

C Quality Assurance and Reliability
Product Specification (V1.4) 05.28.2010
(This specification is subject to change without further notice)
Solderability
Pre-condition
Temperature cycle test
Pressure cooker test
High temperature /
High humidity test
High-temperature
storage life
High-temperature
operating life
Latch-up
ESD (HBM)
ESD (MM)
Test Category
C.1 Address Trap Detect
An address trap detect is one of the MCU embedded fail-safe functions that detects
MCU malfunction caused by noise or the like. Whenever the MCU attempts to fetch an
instruction from a certain section of ROM, an internal recovery circuit is auto started. If
a noise-caused address error is detected, the MCU will repeat execution of the
program until the noise is eliminated. The MCU will then continue to execute the next
program.
Solder temperature=245±5°C, for 5 seconds up to the
stopper using a rosin-type flux
Step 1: TCT, 65°C (15mins)~150°C (15mins), 10 cycles
Step 2: Bake at 125°C, TD (endurance)=24 hrs
Step 3: Soak at 30°C/60%，TD (endurance)=192 hrs
Step 4: IR flow 3 cycles
-65°C (15mins)~150°C (15 min), 200 cycles
TA =121°C, RH=100%, pressure=2 atm,
TD (endurance)= 96 hrs
TA=85°C , RH=85%，TD (endurance) = 168 , 500 hrs
TA=150°C, TD (endurance) = 500, 1000 hrs
TA=125°C, VCC = Max. operating voltage,
TD (endurance) = 168, 500, 1000 hrs
TA=25°C, VCC = Max. operating voltage, 150mA/20V
TA=25°C, ≥ ± 3KV
TA=25°C, ≥
(Pkg thickness ≥ 2.5mm or
Pkg volume ≥ 350mm
(Pkg thickness ≤ 2.5mm or
Pkg volume ≤ 350mm
∣
∣
± 300V
Test Conditions
∣
∣
3
3
----225±5°C)
----240±5°C)
8-Bit Microcontroller with OTP ROM
IP_ND,OP_ND,IO_ND
IP_NS,OP_NS,IO_NS
IP_PD,OP_PD,IO_PD,
IP_PS,OP_PS,IO_PS,
VDD-VSS(+),VDD_VSS
(-) mode
For SMD IC (such as
SOP, QFP, SOJ, etc)
Remarks
EM78P164N
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