MC74VHC1G01DFT2G ON Semiconductor, MC74VHC1G01DFT2G Datasheet - Page 2

• Manufacturer Part Number: MC74VHC1G01DFT2G
• Description: IC GATE NAND SGL 2INP OD SOT-353
• Manufacturer: ON Semiconductor
• Series: 74VHCr

Specifications of MC74VHC1G01DFT2G

• Logic Type: NAND Gate
• Number Of Inputs: 2
• Number Of Circuits: 1
• Current - Output High, Low: 8mA, 8mA
• Voltage - Supply: 2 V ~ 5.5 V
• Operating Temperature: -55°C ~ 125°C
• Mounting Type: Surface Mount
• Package / Case: SC-70-5, SC-88A, SOT-323-5, SOT-353, 5-TSSOP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2−ounce copper trace with no air flow.
2. Tested to EIA/JESD22−A114−A.
3. Tested to EIA/JESD22−A115−A.
4. Tested to JESD22−C101−A.
5. Tested to EIA/JESD78.
DEVICE JUNCTION TEMPERATURE VERSUS
TIME TO 0.1% BOND FAILURES
RECOMMENDED OPERATING CONDITIONS
MAXIMUM RATINGS
I
Symbol
Symbol
LATCHUP
Temperature °C
V
V
V
T
MSL
I
V
V
t
V
I
I
q
V
OUT
r
P
F
OUT
I
STG
T
T
ESD
OUT
T
OK
CC
CC
IK
CC
JA
, t
IN
IN
R
A
L
D
J
Junction
f
100
110
120
130
140
80
90
DC Supply Voltage
DC Input Voltage
DC Output Voltage
DC Input Diode Current
DC Output Diode Current
DC Output Sink Current, per Pin
DC Supply Current, V
Storage Temperature Range
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature Under Bias
Thermal Resistance
Power Dissipation in Still Air at 85°C
Moisture Sensitivity
Flammability Rating
ESD Withstand Voltage
Latchup Performance
DC Supply Voltage
DC Input Voltage
DC Output Voltage
Operating Temperature Range
Input Rise and Fall Time
V
CC
= 3.3 V ± 0.3 V
Time, Hours
1,032,200
419,300
178,700
79,600
37,000
17,800
8,900
CC
and GND Pin
V
CC
Characteristics
Time, Years
= 5.0 V ± 0.5 V
Parameter
Above V
117.8
47.9
20.4
9.4
4.2
2.0
1.0
http://onsemi.com
MC74VHC1G01
CC
and Below GND at 125°C (Note 5)
Charged Device Model (Note 4)
Human Body Model (Note 2)
2
V
OUT
SC70−5/SC−88A (Note 1)
Machine Model (Note 3)
Oxygen Index: 28 to 34
Figure 3. Failure Rate vs. Time Junction Temperature
t GND; V
SC70−5/SC−88A
1
1
OUT
FAILURE RATE OF PLASTIC = CERAMIC
UNTIL INTERMETALLICS OCCUR
TSOP−5
TSOP−5
u V
CC
10
UL 94 V−0 @ 0.125 in
TIME, YEARS
Min
−55
*0.5 to V
2.0
0.0
0.0
0
0
*0.5 to )7.0
*65 to )150
−0.5 to +7.0
Level 1
u2000
Value
)150
u200
$500
$20
$25
N/A
−20
260
350
230
150
200
25
CC
)0.5
100
+125
Max
100
5.5
5.5
7.0
20
1000
°C/W
ns/V
Unit
Unit
mW
mA
mA
mA
mA
mA
°C
°C
°C
°C
V
V
V
V
V
V
V