TC54VC2102ECB MICROCHIP [Microchip Technology], TC54VC2102ECB Datasheet - Page 2

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TC54VC2102ECB

Manufacturer Part Number
TC54VC2102ECB
Description
Voltage Detector
Manufacturer
MICROCHIP [Microchip Technology]
Datasheet

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TC54
1.0
Absolute Maximum Ratings †
Input Voltage ...................................................................+12V
Output Current ..............................................................50 mA
Output Voltage: CMOS................(V
Power Dissipation (T
Operating Temperature Range........................-40°C to +85°C
Storage Temperature Range .........................-65°C to +150°C
DC CHARACTERISTICS
DS21434H-page 2
Electrical Specifications: Unless otherwise noted, T
Operating Voltage
Quiescent Current
Threshold Voltage
(Note 1)
Hysteresis Voltage
Output Current
Tempco of (V
Delay Time
Note 1:
3-Pin SOT-23A .......................................................240 mW
3-Pin SOT-89..........................................................500 mW
5-Pin SOT-23A .......................................................240 mW
3-Pin TO-92 ............................................................300 mW
Parameter
ELECTRICAL
CHARACTERISTICS
For other voltage options, please contact your regional Microchip sales office.
DET
Open-Drain.....................(V
–)
A
≤ 70°C):
T
C
V
V
(V
Sym
I
t
DET
V
HYST
I
OUT
DLY
SS
IN
DET
SS
– )
– 0.3V) to (V
SS
1.37
2.06
2.65
2.84
2.94
4.12
4.21
Min
0.7
0.7
3.0
5.0
6.0
7.0
28
42
54
58
60
84
86
– 0.3V) to 12V
IN
+ 0.3V)
A
= +25°C.
-10.0
±100
10.1
11.5
13.0
Typ
105
135
145
150
210
215
0.8
0.9
1.0
1.1
1.4
2.1
2.7
2.9
3.0
4.2
4.3
7.7
70
Max
10.0
1.43
2.14
2.75
2.96
3.06
4.28
4.39
168
216
232
240
336
344
-2.0
112
6.0
2.7
3.0
3.2
3.6
0.2
† Stresses above those listed under "Absolute Maximum
Ratings" may cause permanent damage to the device. These
are stress ratings only and functional operation of the device
at these or any other conditions above those indicated in the
operation sections of the specifications is not implied.
Exposure to Absolute Maximum Rating conditions for
extended periods may affect device reliability.
ppm/°C -40°C ≤ T
Units
mV
mA
µA
ms
V
V
V
(V
(V
V
V
V
V
TC54VX14
TC54VX21
TC54VX27
TC54VX29
TC54VX30
TC54VX42
TC54VX43
V
V
V
V
V
V
V
V
V
V
V
TC54VC Only:
V
V
IN
IN
IN
IN
DET
DET
DET
DET
DET
DET
DET
OL
OL
OL
OL
OH
DET
DET
DET
= 2.0V
= 3.0V
= 4.0V
= 5.0V
= 0.5V, V
= 0.5V, V
= 0.5V, V
= 0.5V, V
= V
– → V
= 1.4V (typical)
= 2.1V (typical)
= 2.7V (typical)
= 2.9V (typical)
= 3.0V (typical)
= 4.2V (typical)
= 4.3V (typical)
– ) ≥ 1.6V
– ) < 1.6V
IN
© 2007 Microchip Technology Inc.
A
– 2.1V, V
≤ 85°C
OUT
Test Conditions
IN
IN
IN
IN
= 2.0V
= 3.0V
= 4.0V
= 5.0V
inversion
IN
= 8.0V

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