AM29F200AB-70EC Advanced Micro Devices, AM29F200AB-70EC Datasheet

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AM29F200AB-70EC

Manufacturer Part Number

AM29F200AB-70EC

Description

Manufacturer

Advanced Micro Devices

Datasheets

1.AM29F200AT-90EC.pdf (39 pages)

2.AM29F200AT-90EC.pdf (8 pages)

Specifications of AM29F200AB-70EC

Case

TSOP48

Date_code

2006+

Current page: 1 of 8
Download datasheet (119Kb)

Am29F200A Known Good Die

2 Megabit (256 K x 8-Bit/128 K x 16-Bit)

CMOS 5.0 Volt-only, Sectored Flash Memory—Die Revision 1

DISTINCTIVE CHARACTERISTICS

1/13/98

5.0 V

— Minimizes system level power requirements

High performance

— 90 or 120 ns access time

Low power consumption

— 20 mA typical active read current (byte mode)

— 28 mA typical active read current for

— 30 mA typical program/erase current

— 1 A typical standby current

Sector erase architecture

— One 16 Kbyte, two 8 Kbyte, one 32 Kbyte, and

— One 8 Kword, two 4 Kword, one 16 Kword, and

— Supports full chip erase

— Sector Protection features:

(word mode)

three 64 Kbyte sectors (byte mode)

three 32 Kword sectors (word mode)

A hardware method of locking a sector to

prevent any program or erase operations within

that sector

Sectors can be locked via programming

equipment

Temporary Sector Unprotect feature allows code

changes in previously locked sectors

SUPPLEMENT

10% for read and write operations

Top or bottom boot block configurations

available

Embedded Algorithms

— Embedded Erase algorithm automatically

— Embedded Program algorithm automatically

Minimum 100,000 write/erase cycles guaranteed

Compatible with JEDEC standards

— Pinout and software compatible with

— Superior inadvertent write protection

Data# Polling and Toggle Bit

— Detects program or erase cycle completion

Ready/Busy# output (RY/BY#)

— Hardware method for detection of program or

Erase Suspend/Resume

— Supports reading data from a sector not being

Hardware RESET# pin

— Resets internal state machine to the reading

Tested to datasheet specifications at

temperature

Quality and reliability levels equivalent to

standard packaged components

preprograms and erases the entire chip or any

combination of designated sectors

writes and verifies data at specified addresses

single-power-supply flash

erase cycle completion

erased

array data

Publication# 21257

Issue Date: December 1997

Rev: B Amendment/0

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