MAX1254AEUE+ Maxim Integrated, MAX1254AEUE+ Datasheet - Page 25

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MAX1254AEUE+

Manufacturer Part Number
MAX1254AEUE+
Description
Analog to Digital Converters - ADC
Manufacturer
Maxim Integrated
Datasheet

Specifications of MAX1254AEUE+

Number Of Channels
10
Architecture
SAR
Conversion Rate
94 KSPs
Resolution
12 bit
Input Type
Single-Ended/Differential
Interface Type
Serial
Operating Supply Voltage
4.5 V to 5.5 V
Number Of Converters
1
Voltage Reference
Internal 4.096 V or External
At power-on or after a RESET command, the channel-
enable register resets to FF hex, enabling all channels:
the internal temperature sensor, the V
AIN0–AIN7.
At power-on or after a RESET command, the input con-
figuration register resets to 00 hex, configuring
AIN0–AIN7 for single-ended voltage measurement.
At power-on or after a RESET command, the alarm reg-
ister is reset to 000000 hex, indicating that no alarm
condition exists.
At power-on or after a RESET command, each chan-
nel’s current data register is reset to 800 hex.
At power-on or after a RESET command, each chan-
nel's upper threshold register is reset to FFF hex. This
state effectively disables the upper threshold.
At power-on or after a RESET command, each chan-
nel's lower threshold register is reset to 000 hex. This
state effectively disables the lower threshold.
At power-on or after a RESET command, each chan-
nel's configuration register is reset to 000 hex, which
configures the fault bits to cause an alarm to occur on
the first overrange or underrange condition and dis-
ables averaging.
The MAX1253/MAX1254 throughput rate depends on
the number of enabled channels, their configuration
(temperature or voltage), and the reference mode.
Voltage measurements require 10.6µs (typ) to com-
plete, and temperature measurements require 46µs.
Channel pairs configured for differential measurements
count as only one for throughput computation.
The reference system takes 20µs to power up in refer-
ence mode 00 prior to each temperature measurement,
40µs to power up in reference mode 01 after each sam-
with Internal Temperature Sensor and V
Lower Threshold Register Power-Up/Reset Defaults
Upper Threshold Register Power-Up/Reset Defaults
Channel-Enable Register Power-Up/Reset Defaults
Stand-Alone, 10-Channel, 12-Bit System Monitors
Current Data Register Power-Up/Reset Defaults
Alarm Register Power-Up/Reset Defaults
______________________________________________________________________________________
Computing Data Throughput
Channel Configuration Register
Input Configuration Register
Power-Up/Reset Defaults
Power-Up/Reset Defaults
DD
monitor, and
ple wait period (if sample wait time > 80µs), and no
power-up time in reference mode 10.
The sampling period is calculated as follows:
where:
t
t
t
N
t
sion time
N
t
The terms in the above equation are determined as
shown above by the number of enabled channels, the
input channel configuration (voltage vs. temperature),
the sample wait time, and the reference mode. The fol-
lowing calculation shows a numeric example:
• 40µs is the time required for the reference to power-
• 8 x 10.6µs is the time required for seven channels
• 2 x 46µs is the time required for temperature mea-
• 395µs is the sample wait time, set by bits B5, B6, B7
The MAX1253/MAX1254 use an internal clock for all
conversions. The serial interface clock does not affect
conversion time.
Performing eight single-ended remote channels tem-
perature measurements, an internal temperature mea-
surement, and an internal V
sample wait time of zero results in an average conver-
sion rate of 24ksps or 2.4ksps per channel.
Performing eight single-ended voltage measurements, an
internal temperature measurement, and an internal V
measurement with sample wait time of zero results in an
average conversion rate of 70ksps or 7ksps per channel.
sw
pu
conv[volt]
conv[temp]
wait
t
sw
v
t
= number of temperature-configured channels
t
up (reference mode = 00) every time the
MAX1253/MAX1254 come out of automatic shut-
down mode after a sample wait period.
configured for voltage measurement and the V
monitor.
surement (46µs for each temperature measurement
(internal or external)).
of the setup register (see Tables 7 and 8).
= number of voltage-configured channels
sw
= all channels scan sampling period
= reference power-up time
= 40µs + 8 x 10.6µs + 2 x 46µs + 395µs = 611.8µs
= sample wait time
= (t
= voltage-configured channel conversion time
pu
= temperature-configured channel conver-
) + (N
v
)t
conv[volt]
+ (N
DD
DD
t
measurement with a
)t
conv[temp]
Monitor
+ t
wait
DD
DD
25

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