M27C512-70XF1 STMicroelectronics, M27C512-70XF1 Datasheet - Page 11

• Manufacturer Part Number: M27C512-70XF1
• Description: IC EPROM 512KBIT 70NS 28CDIP
• Manufacturer: STMicroelectronics

Specifications of M27C512-70XF1

• Format - Memory: EPROMs
• Memory Type: UV EPROM
• Memory Size: 512K (64K x 8)
• Speed: 70ns
• Interface: Parallel
• Voltage - Supply: 4.75 V ~ 5.25 V
• Operating Temperature: 0°C ~ 70°C
• Package / Case: 28-CDIP (0.600", 15.24mm) Window
• Capacitance, Input: 6 pF
• Capacitance, Output: 12 pF
• Current, Input, Leakage: ±10 μA (Read)
• Current, Operating: 30 mA (Read)
• Current, Output, Leakage: ±10 μA (Read)
• Density: 512K
• Organization: 64K×8
• Package Type: FDIP28W
• Temperature, Operating: 0 to +70 °C
• Time, Access: 70 ns
• Time, Fall: ≤20 ns
• Time, Rise: ≤20 ns
• Voltage, Input, High: 6 V (Read)
• Voltage, Input, Low: 0.8 V (Read)
• Voltage, Output, High: 4.3 V (Read)
• Voltage, Output, Low: 0.4 V (Read)
• Voltage, Supply: 5 V
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: 497-1679-5

M27C512
5
DC and AC parameters
This section summarizes the operating and measurement conditions, and the DC and AC
characteristics of the device. The parameters in the DC and AC Characteristic tables that
follow are derived from tests performed under the Measurement Conditions summarized in
the relevant tables. Designers should check that the operating conditions in their circuit
match the measurement conditions when relying on the quoted parameters.
Table 6.
Figure 5.
Figure 6.
Input Rise and Fall Times
Input Pulse Voltages
Input and Output Timing Ref. Voltages
AC measurement conditions
Testing input/output waveform
AC Testing Load Circuit
High Speed
Standard
2.4V
0.4V
C L = 30pF for High Speed
C L = 100pF for Standard
C L includes JIG capacitance
3V
0V
DEVICE
UNDER
TEST
1.3V
High Speed
0 to 3V
≤ 10ns
1N914
3.3k
1.5V
C L
OUT
AI01823B
1.5V
2.0V
0.8V
AI01822
DC and AC parameters
0.4V to 2.4V
0.8V and 2V
Standard
≤ 20ns
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