AT45DB642D-CU Atmel, AT45DB642D-CU Datasheet - Page 37

IC FLASH MEM 64MBIT 66MHZ 24BGA

AT45DB642D-CU

Manufacturer Part Number
AT45DB642D-CU
Description
IC FLASH MEM 64MBIT 66MHZ 24BGA
Manufacturer
Atmel
Datasheet

Specifications of AT45DB642D-CU

Format - Memory
FLASH
Memory Type
DataFLASH
Memory Size
64M (8192 pages x 1056 bytes)
Speed
66MHz
Interface
Parallel/Serial
Voltage - Supply
2.7 V ~ 3.6 V
Operating Temperature
-40°C ~ 85°C
Package / Case
24-CBGA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
AT45DB642D-CU
Manufacturer:
Atmel
Quantity:
10 000
20. Output Test Load
21. AC Waveforms
21.1
21.2
Note:
3542K–DFLASH–04/09
Waveform 1 – SPI Mode 0 Compatible (for Frequencies up to 66 MHz)
Waveform 2 – SPI Mode 3 Compatible (for Frequencies up to 66 MHz)
To operate the device at 50 MHz in SPI mode, the combined CPU setup time and rise/fall time should be less than 2 ns.
SCK/CLK
SCK/CLK
Six different timing waveforms are shown below. Waveform 1 shows the SCK/CLK signal being
low when CS makes a high-to-low transition, and waveform 2 shows the SCK/CLK signal being
high when CS makes a high-to-low transition. In both cases, output SO becomes valid while the
SCK/CLK signal is still low (SCK/CLK low time is specified as t
conform to RapidS serial interface but for frequencies up to 66 MHz. Waveforms 1 and 2 are
compatible with SPI Mode 0 and SPI Mode 3, respectively.
Waveform 3 and waveform 4 illustrate general timing diagram for RapidS serial interface. These
are similar to waveform 1 and waveform 2, except that output SO is not restricted to become
valid during the t
imum frequency = 66 MHz) of the RapidS serial case. Waveform 5 and waveform 6 are for 8-bit
Rapid8 interface over the full frequency range of operation (maximum frequency = 50 MHz).
CS
SO
SO
CS
SI
SI
HIGH IMPEDANCE
HIGH Z
t
CSS
t
SU
t
t
V
CSS
t
SU
WL
period. These timing waveforms are valid over the full frequency range (max-
VALID IN
t
WL
VALID IN
VALID OUT
t
WH
DEVICE
UNDER
t
TEST
WH
t
V
t
HO
t
H
t
H
t
WL
VALID OUT
30 pF
t
HO
t
CSH
t
CSH
HIGH IMPEDANCE
t
t
t
HIGH IMPEDANCE
t
DIS
CS
DIS
CS
WL
). Timing waveforms 1 and 2
37

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