TCFGB0J226M8R Rohm Semiconductor, TCFGB0J226M8R Datasheet - Page 4

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TCFGB0J226M8R

Manufacturer Part Number
TCFGB0J226M8R
Description
CAP TANT 22UF 6.3V 20% SMD
Manufacturer
Rohm Semiconductor
Series
TCFGr
Type
Moldedr
Datasheet

Specifications of TCFGB0J226M8R

Capacitance
22µF
Voltage - Rated
6.3V
Tolerance
±20%
Esr (equivalent Series Resistance)
2.500 Ohm
Operating Temperature
-55°C ~ 125°C
Mounting Type
Surface Mount
Package / Case
1210 (3528 Metric)
Size / Dimension
0.138" L x 0.110" W (3.50mm x 2.80mm)
Height
0.075" (1.90mm)
Manufacturer Size Code
B
Features
Fail Safe with Built-in Fuse
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Spacing
-
Other names
511-1659-2
TCFG Series B Case
c
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2010 ROHM Co., Ltd. All rights reserved.
Temperature
Stability
Surge
Voltage
Loading at
High
temperature
Terminal
Strength
Adhesiveness
Item
Temp.
ΔC / C
tanδ
L.C
Temp.
ΔC / C
tanδ
L.C
Temp.
ΔC / C
tanδ
L.C
Appearance
L.C
ΔC / C
tanδ
Appearance
L.C
ΔC / C
tanδ
Capacitance
Appearance There should be no significant abnormality.
−55 °C
TCFGB0G227M8R
TCFGB0J227M8R
TCFGB1A107M8R
Others
Shall be satisfied the value on Table5
+85 °C
TCFGB0G227M8R
TCFGB0J227M8R
TCFGB1A107M8R
Others
Shall be satisfied the value on Table5
Less than 1000% of intial limit
+125 °C
TCFGB0J227M8R
TCFGB1A107M8R
TCFGB1C336M8R
Others
Shall be satisfied the value on Table5
Less than 1250% of initial limit
There should be no significant abnormality.
The indications should be clear.
TCFGB0G227M8R
TCFGB0J227M8R
TCFGB1A107M8R
TCFGB1E475M8R
Others
TCFGB0E227M8R
TCFGB0G227M8R
TCFGB0J227M8R
TCFGB1A107M8R
Others
3.3 to 33μF
47 to 150μF
TCFGB0G227M8R
TCFGB0J227M8R
TCFGB1A107M8R
TCFGB1C336M8R
There should be no significant abnormality.
The indications should be clear.
TCFGB0E227M8R
TCFGB0G227M8R
TCFGB0J227M8R
TCFGB1A107M8R
TCFGB1E475M8R
Others
TCFGB0G227M8R
TCFGB0J227M8R
TCFGB1A107M8R
Others
3.3 to 33μF
47 to 100μF
TCFGB0E227M8R
TCFGB0G227M8R
TCFGB0J227M8R
TCFGB1A107M8R
TCFGB1C336M8R
The measured value should be stable.
The terminal should not come off.
: Less than 150% of initial limit
: Less than 200% of initial limit
: Less than 200% of initial limit
: Less than 150% of initial limit
: Less than initial limit
: Within 0/-15% of initial value
: Within 0/-30% of initial value
: Within 0/-30% of initial value
: Within 0/-12% of initial value
: Within +12/0% of initial value
: Within +15/0% of initial value
: Within +15/0% of initial value
: Within +10/0% of initial value
: Within +20/0% of initial value
: Within +20/0% of initial value
: Within +20/0% of initial value
: Within +15/0% of initial value
: Within
: Within
: Within
: Within
: Within
: Within
: Within
: Within
: Within
: Less than 125% of initial limit
: Less than 150% of initial limit
: Less than 200% of initial limit
: Less than 200% of initial limit
: Less than 150% of initial limit
: Less than initial limit
: Less than initial limit
: Less than 150% of initial limit
: Less than 200% of initial limit
: Less than 200% of initial limit
: Less than 200% of initial limit
: Less than 150% of initial limit
: Less than initial limit
: Less than 150% of initial limit
: Less than 150% of initial limit
: Less than 200% of initial limit
: Less than 200% of initial limit
: Less than 200% of initial limit
: Less than 150% of initial limit
Performance
±
±
±
±
±
±
±
±
±
12% of initial value
15% of initial value
20% of initial value
20% of initial value
10% of initial value
15% of initial value
20% of initial value
20% of initial value
10% of initial value
4/7
As per 4.29 JIS C 5101-1
As per 4.13 JIS C 5101-3
As per 4.26 JIS C 5101-1
As per 4.14 JIS C 5101-3
Apply the specified surge voltage via the serial
resistance of 1kΩ every 5±0.5min.
for 30±5 s. each time in the atmospheric condition
of 85±2°C.
Repeat this procedure 1,000 times.
After the specimens, leave it at room temperature
for over 24h and then measure the sample.
As per 4.23 JIS C 5101-1
As per 4.15 JIS C 5101-3
After applying the rated voltage for 2000+72/0h
without discontinuation via the serial resistance
of 3Ω or less at a temperature of 85 ± 2 °C , leave
the sample at room temperature/humidity for
1 to 2h and measure the value.
After the specimens, leave it at room temperature
for over 24h and then measure the sample.
As per 4.35 JIS C 5101-1
As per 4.9 JIS C 5101-3
A force is applied to the terminal until it bends
to 1mm and by a prescribed tool maintain the
condition for 5s. (See the figure below.)
As per 4.34 JIS C 5101-1
As per 4.8 JIS C 5101-3
Apply force of 5N in the two directions shown
in the figure below for 10 ± 1s after mounting
the terminal on a circuit board.
Thickness 1.6mm
(based on JIS C5101-1 and JIS C5101-3)
Test conditions
50
45
R230
product
20
45
F (Apply force)
a circuit board
(Unit : mm)
1
Apply force
2010.01 - Rev.G
Data Sheet

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