R5F21254SNFP#U0 Renesas Electronics America, R5F21254SNFP#U0 Datasheet - Page 30
![IC R8C MCU FLASH 16K 52LQFP](/photos/12/18/121838/r5f21254snfp_u0_sml.jpg)
R5F21254SNFP#U0
Manufacturer Part Number
R5F21254SNFP#U0
Description
IC R8C MCU FLASH 16K 52LQFP
Manufacturer
Renesas Electronics America
Series
R8C/2x/25r
Datasheets
1.R5F211A2SPU0.pdf
(300 pages)
2.R5F21246SDFPU0.pdf
(61 pages)
3.R5F21246SDFPU0.pdf
(527 pages)
Specifications of R5F21254SNFP#U0
Core Processor
R8C
Core Size
16/32-Bit
Speed
20MHz
Connectivity
I²C, LIN, SIO, SSU, UART/USART
Peripherals
POR, Voltage Detect, WDT
Number Of I /o
41
Program Memory Size
16KB (16K x 8)
Program Memory Type
FLASH
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
2.2 V ~ 5.5 V
Data Converters
A/D 12x10b
Oscillator Type
Internal
Operating Temperature
-20°C ~ 85°C
Package / Case
52-LQFP
For Use With
R0K521256S000BE - KIT EVAL STARTER FOR R8C/25
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
R8C/24 Group, R8C/25 Group
Rev.3.00
REJ03B0117-0300
Table 5.4
NOTES:
−
−
−
t
−
−
−
−
−
−
−
d(SR-SUS)
Symbol
1. V
2. Definition of programming/erasure endurance
3. Endurance to guarantee all electrical characteristics after program and erase. (1 to Min. value can be guaranteed).
4. In a system that executes multiple programming operations, the actual erasure count can be reduced by writing to sequential
5. If an error occurs during block erase, attempt to execute the clear status register command, then execute the block erase
6. Customers desiring program/erase failure rate information should contact their Renesas technical support representative.
7. The data hold time includes time that the power supply is off or the clock is not supplied.
The programming and erasure endurance is defined on a per-block basis.
If the programming and erasure endurance is n (n = 100 or 10,000), each block can be erased n times. For example, if 1,024
1-byte writes are performed to block A, a 1 Kbyte block, and then the block is erased, the programming/erasure endurance
still stands at one.
However, the same address must not be programmed more than once per erase operation (overwriting prohibited).
addresses in turn so that as much of the block as possible is used up before performing an erase operation. For example,
when programming groups of 16 bytes, the effective number of rewrites can be minimized by programming up to 128 groups
before erasing them all in one operation. It is also advisable to retain data on the erase count of each block and limit the
number of erase operations to a certain number.
command at least three times until the erase error does not occur.
CC
Feb 29, 2008
= 2.7 to 5.5 V at T
Program/erase endurance
Byte program time
Block erase time
Time delay from suspend request until
suspend
Interval from erase start/restart until
following suspend request
Interval from program start/restart until
following suspend request
Time from suspend until program/erase
restart
Program, erase voltage
Read voltage
Program, erase temperature
Data hold time
Flash Memory (Program ROM) Electrical Characteristics
opr
Page 28 of 51
(7)
Parameter
= 0 to 60°C, unless otherwise specified.
(2)
R8C/24 Group
R8C/25 Group
Ambient temperature = 55°C
Conditions
1,000
100
Min.
650
2.7
2.2
20
−
−
−
0
−
0
(3)
(3)
Standard
Typ.
5. Electrical Characteristics
0.4
50
−
−
−
−
−
−
−
−
−
−
97+CPU clock
3+CPU clock
× 6 cycles
× 4 cycles
Max.
400
5.5
5.5
60
−
−
9
−
−
−
times
times
year
Unit
µs
µs
µs
ns
µs
°C
V
V
s