S9S08SG16E1CTLR Freescale Semiconductor, S9S08SG16E1CTLR Datasheet - Page 291
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S9S08SG16E1CTLR
Manufacturer Part Number
S9S08SG16E1CTLR
Description
IC MCU 8BIT 16KB FLASH 28TSSOP
Manufacturer
Freescale Semiconductor
Series
HCS08r
Datasheet
1.S9S08SG16E1CTG.pdf
(330 pages)
Specifications of S9S08SG16E1CTLR
Core Processor
HCS08
Core Size
8-Bit
Speed
40MHz
Connectivity
I²C, LIN, SCI, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
22
Program Memory Size
16KB (16K x 8)
Program Memory Type
FLASH
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Data Converters
A/D 16x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
28-TSSOP
Processor Series
S08SG
Core
HCS08
Mounting Style
SMD/SMT
3rd Party Development Tools
EWS08
Development Tools By Supplier
DEMO9S08SG32, DEMO9S08SG32AUTO, DEMO9S08SG8, DEMO9S08SG8AUTO
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Other names
S9S08SG16E1CTLRTR
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Appendix A
Electrical Characteristics
A.1
This section contains electrical and timing specifications for the MC9S08SG32 Series of microcontrollers
available at the time of publication. The MC9S08SG32 Series includes both:
A.2
The electrical parameters shown in this supplement are guaranteed by various methods. To give the
customer a better understanding, the following classification is used and the parameters are tagged
accordingly in the tables where appropriate:
A.3
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not
guaranteed. Stress beyond the limits specified in
permanent damage to the device. For functional operating conditions, refer to the remaining tables in this
section.
Freescale Semiconductor
•
•
Standard (STD)— devices that are standard-temperature rated. Table rows marked with a
indicate electrical characteristics that apply to these devices.
AEC Grade 0 — devices that are high-temperature rated. Table rows marked with a
electrical characteristics that apply to AEC Grade 0 devices.
C
D
P
T
Introduction
Parameter Classification
Absolute Maximum Ratings
Those parameters are guaranteed during production testing on each individual device.
Those parameters are achieved through the design characterization by measuring a statistically relevant
sample size across process variations.
Those parameters are achieved by design characterization on a small sample size from typical devices
under typical conditions unless otherwise noted. All values shown in the typical column are within this
category.
Those parameters are derived mainly from simulations.
The classification is shown in the column labeled “C” in the parameter
tables where appropriate.
Table A-1. Parameter Classifications
MC9S08SG32 Data Sheet, Rev. 8
Table A-2
NOTE
may affect device reliability or cause
♦
indicate
♦
291
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