DSP56F801FA80 Freescale Semiconductor, DSP56F801FA80 Datasheet - Page 14

• Manufacturer Part Number: DSP56F801FA80
• Description: IC DSP 80MHZ 8K FLASH 48-LQFP
• Manufacturer: Freescale Semiconductor
• Series: 56F8xxr

Specifications of DSP56F801FA80

• Core Processor: 56800
• Core Size: 16-Bit
• Speed: 80MHz
• Connectivity: SCI, SPI
• Peripherals: POR, PWM, WDT
• Number Of I /o: 11
• Program Memory Size: 20KB (10K x 16)
• Program Memory Type: FLASH
• Ram Size: 2K x 16
• Voltage - Supply (vcc/vdd): 3 V ~ 3.6 V
• Data Converters: A/D 8x12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 48-LQFP
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Eeprom Size: -
• Other names: DSP56F801BU80; DSP56F801BU80

2.10 JTAG/OnCE
Part 3 Specifications
3.1 General Characteristics
The 56F801 is fabricated in high-density CMOS with 5-volt tolerant TTL-compatible digital inputs. The
term “5-volt tolerant” refers to the capability of an I/O pin, built on a 3.3V compatible process technology,
to withstand a voltage up to 5.5V without damaging the device. Many systems have a mixture of devices
designed for 3.3V and 5V power supplies. In such systems, a bus may carry both 3.3V and 5V- compatible
I/O voltage levels (a standard 3.3V I/O is designed to receive a maximum voltage of 3.3V ± 10% during
normal operation without causing damage). This 5V-tolerant capability therefore offers the power savings
of 3.3V I/O levels while being able to receive 5V levels without being damaged.
Absolute maximum ratings given in
maximum is not guaranteed. Stress beyond these ratings may affect device reliability or cause permanent
damage to the device.
14
No. of
Pins
1
1
1
1
1
1
Signal
Name
TRST
TMS
TDO
TCK
TDI
DE
(Schmitt)
(Schmitt)
(Schmitt)
(Schmitt)
Signal
Output
Output
Type
Input
Input
Input
Input
Table 2-12 JTAG/On-Chip Emulation (OnCE) Signals
high internally
high internally
high internally
State During
low internally
Input, pulled
Input, pulled
Input, pulled
Input, pulled
Tri-stated
Output
Reset
Table 3-1
56F801 Technical Data, Rev. 17
Test Clock Input—This input pin provides a gated clock to synchronize the
test logic and shift serial data to the JTAG/OnCE port. The pin is connected
internally to a pull-down resistor.
Test Mode Select Input—This input pin is used to sequence the JTAG
TAP controller’s state machine. It is sampled on the rising edge of TCK and
has an on-chip pull-up resistor.
Note:
Test Data Input—This input pin provides a serial input data stream to the
JTAG/OnCE port. It is sampled on the rising edge of TCK and has an
on-chip pull-up resistor.
Test Data Output—This tri-statable output pin provides a serial output data
stream from the JTAG/OnCE port. It is driven in the Shift-IR and Shift-DR
controller states, and changes on the falling edge of TCK.
Test Reset—As an input, a low signal on this pin provides a reset signal to
the JTAG TAP controller. To ensure complete hardware reset, TRST should
be asserted whenever RESET is asserted. The only exception occurs in a
debugging environment when a hardware device reset is required and it is
necessary not to reset the OnCE/JTAG module. In this case, assert RESET,
but do not assert TRST.
Note:
used in a debugging environment, TRST may be tied to V
Debug Event—DE provides a low pulse on recognized debug events.
Always tie the TMS pin to V
For normal operation, connect TRST directly to V
are stress ratings only, and functional operation at the
Signal Description
DD
through a 2.2K resistor.
Freescale Semiconductor
SS
SS
through a 1K resistor.
. If the design is to be