MAX4162ESA Maxim Integrated Products, MAX4162ESA Datasheet - Page 11

• Manufacturer Part Number: MAX4162ESA
• Description: IC OPAMP MICROPWR SNGL R-R 8SOIC
• Manufacturer: Maxim Integrated Products

Specifications of MAX4162ESA

• Amplifier Type: General Purpose
• Number Of Circuits: 1
• Output Type: Rail-to-Rail
• Slew Rate: 0.115 V/µs
• Gain Bandwidth Product: 200kHz
• Current - Input Bias: 1pA
• Voltage - Input Offset: 500µV
• Current - Supply: 25µA
• Current - Output / Channel: 15mA
• Voltage - Supply, Single/dual (±): 2.7 V ~ 10 V, ±1.35 V ~ 5 V
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 8-SOIC (3.9mm Width)
• Number Of Channels: 1
• Voltage Gain Db: 120 dB
• Common Mode Rejection Ratio (min): 70 dB
• Input Offset Voltage: 3 mV
• Operating Supply Voltage: 3 V, 5, V, 9 V
• Supply Current: 0.025 mA
• Maximum Power Dissipation: 588 mW
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• Maximum Dual Supply Voltage: +/- 5 V
• Minimum Operating Temperature: - 40 C
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• -3db Bandwidth: -

1) The on-board charge pumps generate a small
2) The charge pumps typically require up to 20µs on
The MAX4162/MAX4163/MAX4164 are guaranteed to
operate from a single 2.5V to 10.0V power supply, but
full rail-to-rail operation typically extends below 2V. For
single-supply operation, bypass the power supply with a
1µF capacitor in parallel with a 0.1µF ceramic capacitor.
If operating from dual supplies, bypass each supply to
ground.
Good layout improves performance by decreasing the
amount of stray capacitance at the op amp’s inputs and
output. To decrease stray capacitance, minimize both
trace and external component lead lengths, and place
external components close to the op amp’s pins.
Table 1. Reliability Test Data
Temperature Cycle
Operating Life
Moisture Resistance
Low-Temperature Storage
Low-Temperature Operational
Solderability
ESD
High-Temperature Operating
Life
amount of 700kHz switching noise at the op amp’s
output. The amplitude of this noise is typically
100µV
is independent of amplifier gain. The charge-pump
switching frequency is well beyond the amplifier’s
200kHz bandwidth, and is therefore unnoticeable in
most applications.
power-up to fully energize the internal supply rails
(Figure 3).
P-P
TEST
. The noise is not referred to the input, and
______________________________________________________________________________________
Power Supplies and Layout
UCSP, Micropower, Single-Supply, 10V,
-35°C to +85°C, -40°C to +100°C
T
-20°C to +60°C, 90% RH
-20°C
-10°C
8h steam age
±2000V, Human Body Model
T
A
J
= +150°C
= +70°C
CONDITIONS
Rail-to-Rail I/O Op Amps
For general UCSP package information and PC layout
considerations, please refer to the Maxim Application
Note (Wafer-Level Ultra-Chip-Board-Scale-Package).
The UCSP represents a unique packaging form factor
that may not perform equally to a packaged product
through traditional mechanical reliability tests. UCSP
reliability is integrally linked to the user’s assembly
methods, circuit board material, and usage environ-
ment. The user should closely review these areas when
considering use of a UCSP. Performance through oper-
ating life test and moisture resistance remains uncom-
promised as it is primarily determined by the
wafer-fabrication process. Mechanical stress perfor-
mance is a greater consideration for a UCSP package.
UCSPs are attached through direct solder contact to
the user’s PC board, foregoing the inherent stress relief
of a packaged product lead frame. Solder joint contact
integrity must be considered.
Table 1 shows the testing done to characterize the
UCSP reliability performance. In conclusion, the UCSP
is capable of performing reliably through environmental
stresses as indicated by the results in the table.
Additional usage data and recommendations are
detailed in the UCSP application note, which can be
found on Maxim’s website at www.maxim-ic.com.
150 cycles, 900 cycles
DURATION
240h
240h
240h
168h
24h
—
—
UCSP Package Consideration
UCSP Reliability
NO. OF FAILURES PER
SAMPLE SIZE
0/10, 0/200
0/10
0/10
0/10
0/10
0/15
0/45
0/5
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