ALD110808PCL Advanced Linear Devices Inc, ALD110808PCL Datasheet - Page 2

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ALD110808PCL

Manufacturer Part Number
ALD110808PCL
Description
MOSFET N-CH 10.6V QUAD 16PDIP
Manufacturer
Advanced Linear Devices Inc
Series
EPAD®r
Datasheet

Specifications of ALD110808PCL

Package / Case
16-DIP (0.300", 7.62mm)
Fet Type
4 N-Channel (H-Bridge)
Fet Feature
Standard
Drain To Source Voltage (vdss)
10.6V
Vgs(th) (max) @ Id
820mV @ 1µA
Power - Max
500mW
Mounting Type
Through Hole
Minimum Operating Temperature
0 C
Configuration
Quad
Transistor Polarity
N-Channel
Resistance Drain-source Rds (on)
500 Ohm (Typ) @ 4.8 V
Forward Transconductance Gfs (max / Min)
0.0014 S
Drain-source Breakdown Voltage
10.6 V
Gate-source Breakdown Voltage
10.6 V
Continuous Drain Current
12 mA
Power Dissipation
500 mW
Maximum Operating Temperature
+ 70 C
Mounting Style
Through Hole
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Gate Charge (qg) @ Vgs
-
Current - Continuous Drain (id) @ 25° C
-
Rds On (max) @ Id, Vgs
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
1014-1026

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ALD110808PCL
Manufacturer:
Advanced Linear Devices Inc
Quantity:
135
ABSOLUTE MAXIMUM RATINGS
Drain-Source voltage,
Gate-Source voltage,
Power dissipation
Operating temperature range SCL, PCL, SAL, PAL package
Storage temperature range
Lead temperature, 10 seconds
OPERATING ELECTRICAL CHARACTERISTICS
V+ = +5V V- = GND T A = 25
CAUTION:
Notes:
ALD110808/ALD110808A/ALD110908/ALD110908A
Gate Threshold Voltage
Offset Voltage
V GS1 -V GS2
GateThreshold Tempco
On Drain Current
Forward Transconductance
Transconductance Mismatch
Output Conductance
Drain Source On Resistance
Drain Source On Resistance
Mismatch
Drain Source Breakdown
Voltage
Drain Source Leakage Current
Gate Leakage Current1
Input Capacitance
Transfer Reverse Capacitance
Turn-on Delay Time
Turn-off Delay Time
Crosstalk
V GS1 -V GS2 Tempco
Parameter
1
Consists of junction leakage currents
ESD Sensitive Device. Use static control procedures in ESD controlled environment.
V
V
GS
DS
1
V GS(th)
V OS
∆V OS
∆V GS(th)
I DS (ON)
G FS
∆G FS
G OS
R DS (ON)
∆R DS (ON)
BV DSX
I DS (OFF)
I GSS
C ISS
C RSS
t on
t off
°
Symbol
C unless otherwise specified
ALD110808A / ALD110908A ALD110808/ ALD110908
Min
0.78
10
Typ
+1.6
0.80
12.0
-1.7
500
0.0
3.0
1.4
1.8
0.5
2.5
0.1
Advanced Linear Devices
68
10
10
10
60
1
5
3
Max
0.82
400
200
2
4
1
Min
0.78
10
Typ
+1.6
0.80
12.0
-1.7
500
0.0
3.0
1.4
1.8
0.5
2.5
0.1
68
10
10
10
60
3
5
3
Max
0.82
400
200
10
4
1
-65°C to +150°C
Unit
mV
µV/ °C
mV/ °C
mA
mmho
%
µmho
%
V
pA
nA
pA
nA
pF
pF
ns
ns
dB
V
0°C to +70°C
500 mW
+260°C
Test Condition
I DS =1µA, V DS = 0.1V
I DS =1µA
V DS1 = V DS2
I D = 1µA, V DS = 0.1V
I D = 20µA, V DS = 0.1V
I D = 40µA, V DS = 0.1V
V GS = +10.3V, V DS = +5V
V GS = +4.8V, V DS = +5V
V GS = +4.8V
V DS = +9.8V
V GS =+4.8V
V DS = +9.8V
V DS = 0.1V
V GS = +4.8V
I DS = 1.0µA
V GS = -0.2V
V GS = -0.2V
V DS = 5V, T A = 125°C
V DS = 0V, V GS = 5V
T A =125°C
V + = 5V R L = 5KΩ
V + = 5V R L = 5KΩ
f = 100KHz
10.6V
10.6V
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