STM32L152-EVAL STMicroelectronics, STM32L152-EVAL Datasheet - Page 70
STM32L152-EVAL
Manufacturer Part Number
STM32L152-EVAL
Description
BOARD EVALUATION FOR STM32L
Manufacturer
STMicroelectronics
Type
MCUr
Specifications of STM32L152-EVAL
New! Us2012 Catalog Page
STM8L-Discovery_STM32L152-EVAL
Contents
Board
Processor To Be Evaluated
STM32L1xxx
Interface Type
UART
Operating Supply Voltage
2 V to 3.6 V
For Use With/related Products
STM32L
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
497-10842
- Current page: 70 of 107
- Download datasheet (2Mb)
Electrical characteristics
6.3.9
70/107
EMC characteristics
Susceptibility tests are performed on a sample basis during device characterization.
Functional EMS (electromagnetic susceptibility)
While a simple application is executed on the device (toggling 2 LEDs through I/O ports). the
device is stressed by two electromagnetic events until a failure occurs. The failure is
indicated by the LEDs:
●
●
A device reset allows normal operations to be resumed.
The test results are given in
defined in application note AN1709.
Table 33.
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
●
●
●
V
V
Symbol
FESD
EFTB
Electrostatic discharge (ESD) (positive and negative) is applied to all device pins until
a functional disturbance occurs. This test is compliant with the IEC 61000-4-2 standard.
FTB: A Burst of Fast Transient voltage (positive and negative) is applied to V
V
compliant with the IEC 61000-4-4 standard.
Corrupted program counter
Unexpected reset
Critical data corruption (control registers...)
SS
through a 100 pF capacitor, until a functional disturbance occurs. This test is
Voltage limits to be applied on any I/O pin to
induce a functional disturbance
Fast transient voltage burst limits to be
applied through 100 pF on V
pins to induce a functional disturbance
EMS characteristics
Parameter
Table
Doc ID 17659 Rev 4
33. They are based on the EMS levels and classes
DD
and V
SS
V
f
conforms to IEC 61000-4-2
V
f
conforms to IEC 61000-4-4
HCLK
HCLK
DD
DD
3.3 V, LQFP100, T
3.3 V, LQFP100, T
32 MHz
32 MHz
STM32L151xx, STM32L152xx
Conditions
A
A
+25 °C,
+25 °C,
DD
and
Level/
Class
2B
4A
Related parts for STM32L152-EVAL
Image
Part Number
Description
Manufacturer
Datasheet
Request
R
Part Number:
Description:
IAR™ starter kit for STM32L EnergyLite 32-bit microcontrollers
Manufacturer:
STMICROELECTRONICS [STMicroelectronics]
Datasheet:
Part Number:
Description:
MCU, MPU & DSP Development Tools STM32L152VBT6 IAR 32KB Workbench
Manufacturer:
STMicroelectronics
Datasheet:
Part Number:
Description:
16/32-BITS MICROS
Manufacturer:
STMicroelectronics
Datasheet:
Part Number:
Description:
BOARD, EVAL, STM32L-DISCOVERY
Manufacturer:
STMicroelectronics
Datasheet:
Part Number:
Description:
STMicroelectronics [RIPPLE-CARRY BINARY COUNTER/DIVIDERS]
Manufacturer:
STMicroelectronics
Datasheet:
Part Number:
Description:
STMicroelectronics [LIQUID-CRYSTAL DISPLAY DRIVERS]
Manufacturer:
STMicroelectronics
Datasheet:
Part Number:
Description:
BOARD EVAL FOR MEMS SENSORS
Manufacturer:
STMicroelectronics
Datasheet:
Part Number:
Description:
NPN TRANSISTOR POWER MODULE
Manufacturer:
STMicroelectronics
Datasheet:
Part Number:
Description:
TURBOSWITCH ULTRA-FAST HIGH VOLTAGE DIODE
Manufacturer:
STMicroelectronics
Datasheet:
Part Number:
Description:
Manufacturer:
STMicroelectronics
Datasheet:
Part Number:
Description:
DIODE / SCR MODULE
Manufacturer:
STMicroelectronics
Datasheet:
Part Number:
Description:
DIODE / SCR MODULE
Manufacturer:
STMicroelectronics
Datasheet: