DE2E3KH222MA3B Murata, DE2E3KH222MA3B Datasheet - Page 40

• Manufacturer Part Number: DE2E3KH222MA3B
• Description: Ceramic Disc Capacitors Class X1 Y2 2200pF 250Vac E 20%
• Manufacturer: Murata
• Series: DE2r

Specifications of DE2E3KH222MA3B

• Voltage Rating: 250 Volts
• Operating Temperature Range: - 25 C to + 125 C
• Termination Style: Radial
• Product: Ceramic Disc Capacitors - Other Various
• Dimensions: 10 mm Dia.
• Capacitance: 2200 pF
• Tolerance: 20 %
• Temperature Coefficient: E
• Lead Spacing: 7.5 mm
• Capacitor Dielectric Type: CERAMIC DISC AND PLATE
• Tolerance,: 20%
• Tolerance, -: 20%
• Temp, Op. Max: 125(DEGREE C)
• Temp, Op. Min: -25(DEGREE C)
• Pitch,: ROHS COMPLIANT
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

7
!Note
38
No.
13
14
15
16
17 Life
* "Room condition" Temperature: 15 to 35 C, Relative humidity: 45 to 75%, Atmospheric pressure: 86 to 106kPa
DEH Series (125 C Guaranteed / Low-dissipation Factor / DC250V-3.15kV) Specifications and Test Methods
DEH Series Specifications and Test Methods
Continued from the preceding page.
Soldering Effect
(On-Preheat)
Temperature
Cycle
Humidity (Under
Steady State)
Humidity
Loading
• Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this catalog to prevent smoking and/or burning, etc.
• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please review our product specifications or consult the approval sheet for product specifications before ordering.
Item
Appearance
Capacitance
Change
Dielectric Strength
(Between Lead
Wires)
Appearance
Capacitance
Change
D.F.
I.R.
Dielectric Strength
(Between Lead
Wires)
Appearance
Capacitance
Change
D.F.
I.R.
Appearance
Capacitance
Change
D.F.
I.R.
Appearance
Capacitance
Change
D.F.
I.R.
No marked defect
Within 10%
Per item 4.
No marked defect
Within 10%
0.4% max.
1000M min.
Per item 4.
No marked defect
Within 10%
0.4% max.
1000M min.
No marked defect
Within 10%
0.6% max.
1000M min.
No marked defect
Within 10%
0.4% max.
2000M min.
Specifications
First the capacitor should be
stored at 120+0/-5 C for
60+0/-5 sec.
Then, as in the figure, the lead
wires should be immersed in
solder of 260+0/-5 C up to 1.5 to
2.0mm from the root of terminal
for 7.5+0/-1 sec.
Pre-treatment:
Post-treatment:
The capacitor should be subjected to 5 temperature cycles.
<Temperature Cycle>
Pre-treatment:
Post-treatment:
Set the capacitor for 500 +24/-0 hrs. at 40 2 C in 90 to 95%
relative humidity.
Pre-treatment:
Post-treatment:
Apply the rated voltage for 500+24/-0 hrs. at 40 2 C in 90 to
95% relative humidity. (Charge/Discharge currentV50mA)
Pre-treatment:
Post-treatment:
Apply a DC voltage of 200% of the rated voltage (DC500V) or
DC voltage of 150% of the rated voltage (DC1 to 3.15kV) for
1000 +48/-0 hrs. at 125 2 C with a relative humidity of 50%
max.
(Charge/Discharge currentV50mA)
Pre-treatment:
Post-treatment:
Capacitor should be stored at 125 3 C for 1 hr., then placed
at room condition* for 24 2 hrs. before initial measurements.
Capacitor should be stored for 24 2 hrs. at room condition.*
Capacitor should be stored at 125 3 C for 1 hr., then placed
at room condition* for 24 2 hrs. before initial measurements.
Capacitor should be stored for 24 2 hrs. at room condition.*
Capacitor should be stored at 125 3 C for 1 hr., then placed
at room condition* for 24 2 hrs. before initial measurements.
Capacitor should be stored for 1 to 2 hrs. at room condition.*
Capacitor should be stored at 125 3 C for 1 hr., then placed at
room condition* for 24 2 hrs. before initial measurements.
Capacitor should be stored for 1 to 2 hrs. at room condition.*
Capacitor should be stored at 125 3 C for 1 hr., then placed
at room condition* for 24 2 hrs. before initial measurements.
Capacitor should be stored at 125 3 C for 1 hr., then placed
at room condition* for 24 2 hrs.
Step
1
2
3
4
Temperature ( C)
Test Method
Room Temp.
Room Temp.
125 3
-25 3
Cycle time: 5 cycles
Thermal
Screen
Time (min)
30
30
3
3
Capacitor
Molten
Solder
1.5
to 2.0mm
C85E.pdf
Jul.13,2011