MRF8S18260HSR6 Freescale Semiconductor, MRF8S18260HSR6 Datasheet - Page 2

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MRF8S18260HSR6

Manufacturer Part Number
MRF8S18260HSR6
Description
MOSFET RF N-CH 260W NI1230S-8
Manufacturer
Freescale Semiconductor
Datasheet

Specifications of MRF8S18260HSR6

Voltage - Rated
65V
Transistor Type
LDMOS (Dual)
Frequency
1.81GHz
Gain
17.9dB
Current - Test
1.6A
Voltage - Test
30V
Power - Output
74W
Package / Case
SOT-1110B
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Current Rating
-
Noise Figure
-

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MRF8S18260HSR6
Manufacturer:
FREESCALE
Quantity:
100
2
MRF8S18260HR6 MRF8S18260HSR6
Table 3. ESD Protection Characteristics
Table 4. Electrical Characteristics
Off Characteristics
On Characteristics
Functional Tests
Single--Carrier W--CDMA, IQ Magnitude Clipping, Input Signal PAR = 7.5 dB @ 0.01% Probability on CCDF. ACPR measured in 3.84 MHz
Channel Bandwidth @ ±5 MHz Offset.
Typical Broadband Performance (In Freescale Test Fixture, 50 ohm system) V
W--CDMA, IQ Magnitude Clipping, Input Signal PAR = 7.5 dB @ 0.01% Probability on CCDF. ACPR measured in 3.84 MHz Channel Bandwidth
@ ±5 MHz Offset.
Human Body Model (per JESD22--A114)
Machine Model (per EIA/JESD22--A115)
Charge Device Model (per JESD22--C101)
Zero Gate Voltage Drain Leakage Current
Zero Gate Voltage Drain Leakage Current
Gate--Source Leakage Current
Gate Threshold Voltage
Gate Quiescent Voltage
Fixture Gate Quiescent Voltage
Drain--Source On--Voltage
Power Gain
Drain Efficiency
Output Peak--to--Average Ratio @ 0.01% Probability on CCDF
Adjacent Channel Power Ratio
Input Return Loss
1. Gates (Pins 2, 3) and drains (Pins 6, 7) are connected internally.
2. Part internally matched both on input and output.
(V
(V
(V
(V
(V
(V
(V
DS
DS
GS
DS
DS
DD
GS
= 65 Vdc, V
= 28 Vdc, V
= 5 Vdc, V
= 10 Vdc, I
= 30 Vdc, I
= 30 Vdc, I
= 10 Vdc, I
(1,2)
DS
D
D
D
D
(1)
(1)
GS
GS
= 400 μAdc)
= 1600 mA)
= 1600 mA, Measured in Functional Test)
= 4 Adc)
(In Freescale Test Fixture, 50 ohm system) V
= 0 Vdc)
= 0 Vdc)
= 0 Vdc)
Characteristic
Frequency
1805 MHz
1840 MHz
1880 MHz
Test Methodology
(T
A
= 25°C unless otherwise noted)
DD
= 30 Vdc, I
Symbol
V
V
V
V
ACPR
DD
I
I
I
DS(on)
PAR
(dB)
17.9
17.9
17.9
GS(th)
GG(Q)
G
GS(Q)
G
IRL
DSS
DSS
GSS
η
DQ
ps
ps
D
= 30 Vdc, I
= 1600 mA, P
16.8
29.0
DQ
31.6
31.9
32.5
Min
(%)
1.1
4.3
0.1
5.4
η
D
= 1600 mA, P
out
= 74 W Avg., f = 1805 MHz,
Output PAR
--35.0
0.15
17.9
31.6
(dB)
Typ
--19
1.9
2.6
5.1
6.0
6.0
6.0
5.9
IV (Minimum)
A (Minimum)
2 (Minimum)
out
Class
= 74 W Avg., Single--Carrier
Freescale Semiconductor
ACPR
--32.0
(dBc)
--35.0
--36.0
--36.0
Max
19.0
2.6
5.8
0.3
10
--7
1
1
RF Device Data
(continued)
μAdc
μAdc
μAdc
Unit
(dB)
Vdc
Vdc
Vdc
Vdc
dBc
IRL
--19
--18
dB
dB
dB
--8
%

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