STM32F103VFT6 STMicroelectronics, STM32F103VFT6 Datasheet - Page 108

MCU ARM CORTEX MCU 768KB 100LQFP

STM32F103VFT6

Manufacturer Part Number
STM32F103VFT6
Description
MCU ARM CORTEX MCU 768KB 100LQFP
Manufacturer
STMicroelectronics
Series
STM32r
Datasheet

Specifications of STM32F103VFT6

Core Processor
ARM® Cortex-M3™
Core Size
32-Bit
Speed
72MHz
Connectivity
CAN, I²C, IrDA, LIN, SPI, UART/USART, USB
Peripherals
DMA, Motor Control PWM, PDR, POR, PVD, PWM, Temp Sensor, WDT
Number Of I /o
80
Program Memory Size
768KB (768K x 8)
Program Memory Type
FLASH
Ram Size
96K x 8
Voltage - Supply (vcc/vdd)
2 V ~ 3.6 V
Data Converters
A/D 16x12b; D/A 2x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
100-LFQFP
Processor Series
STM32F101xF
Core
ARM Cortex M3
Data Bus Width
32 bit
Data Ram Size
80 KB
Interface Type
I2C, SPI, UART
Maximum Clock Frequency
36 MHz
Number Of Programmable I/os
112
Number Of Timers
15
Operating Supply Voltage
2 V to 3.6 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Operating Temperature Range
- 40 C to + 105 C
Processor To Be Evaluated
STM32F103VF
Supply Current (max)
28 mA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details

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0
Electrical characteristics
Table 63.
1. Guaranteed by design, not tested in production.
2. Preliminary values.
Figure 59. 12-bit buffered /non-buffered DAC
1. The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external loads directly
108/120
INL
Offset
Gain
error
t
Update
rate
t
PSRR+
SETTLING
WAKEUP
Symbol
without the use of an external operational amplifier. The buffer can be bypassed by configuring the BOFFx bit in the
DAC_CR register.
(2)
(2)
(2)
(2)
(1)
(2)
(2)
Integral non linearity
(difference between
measured value at Code i
and the value at Code i on a
line drawn between Code 0
and last Code 1023)
Offset error
(difference between
measured value at Code
(0x800) and the ideal value =
V
Gain error
Settling time (full scale: for a
10-bit input code transition
between the lowest and the
highest input codes when
DAC_OUT reaches final
value ±1LSB
Max frequency for a correct
DAC_OUT change when
small variation in the input
code (from code i to i+1LSB)
Wakeup time from off state
(Setting the ENx bit in the
DAC Control register)
Power supply rejection ratio
(to V
measurement
DAC characteristics (continued)
REF+
DDA
/2)
) (static DC
Parameter
Buffered/Non-buffered DAC
12-bit
digital to
analog
converter
Min
Doc ID 16554 Rev 2
3
6.5
–67
Buffer(1)
Typ
±1
±4
±10
±3
±12
±0.5
4
1
10
–40
Max
DACx_OUT
LSB
LSB
mV
LSB
LSB
%
µs
MS/s C
µs
dB
Unit
C
R
Given for the DAC in 10-bit
configuration
Given for the DAC in 12-bit
configuration
Given for the DAC in 12-bit
configuration
Given for the DAC in 10-bit at V
= 3.6 V
Given for the DAC in 12-bit at V
= 3.6 V
Given for the DAC in 12bit
configuration
C
C
input code between lowest and
highest possible ones.
No R
LOAD
LOAD
LOAD
LOAD
LOAD
STM32F103xF, STM32F103xG
LOAD
 50 pF, R
 50 pF, R
 50 pF, R
, C
LOAD
Comments
ai17157
LOAD
LOAD
LOAD
= 50 pF
 5 k
 5 k
 5 k
REF+
REF+

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