CAT24WC128WI CATALYST SEMICONDUCTOR, CAT24WC128WI Datasheet - Page 2

• Manufacturer Part Number: CAT24WC128WI
• Description: EEPROM SERIAL 128K, 24WC128, SOIC8
• Manufacturer: CATALYST SEMICONDUCTOR

Specifications of CAT24WC128WI

• Memory Size: 128Kbit
• Clock Frequency: 1MHz
• Supply Voltage Range: 1.8V To 6V
• Memory Case Style: SOIC
• No. Of Pins: 8
• Operating Temperature Range: -40°C To +85°C
• Svhc: No SVHC (18-Jun-2010)
• Package /: RoHS Compliant
• Memory Configuration: 16384 X 8
• Interface Type: I2C, Serial, 2-Wire
• Rohs Compliant: Yes

V
Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V
(5) Maximum standby current (I
Temperature Under Bias ................. –55°C to +125°C
Storage Temperature ....................... –65°C to +150°C
Voltage on Any Pin with
V
Package Power Dissipation
Lead Soldering Temperature (10 secs) ............ 300°C
Output Short Circuit Current
I
I
I
I
I
V
V
V
V
Doc. No. 1038, Rev. D
CC1
CC2
SB
LI
LO
CC
CC
IL
IH
OL1
OL2
N
T
V
I
LTH
voltage on output pins is V
Respect to Ground
Capability (Ta = 25°C) ................................... 1.0W
DR
ZAP
(5)
END
C
C
with Respect to Ground ............... –2.0V to +7.0V
= +1.8V to +6.0V, unless otherwise specified.
I/O
IN
(3)
(3)(4)
(3)
(3)
(3)
(3)
Power Supply Current - Read
Power Supply Current - Write
Standby Current
Input Leakage Current
Output Leakage Current
Input Low Voltage
Input High Voltage
Output Low Voltage (V
Output Low Voltage (V
Endurance
Data Retention
ESD Susceptibility
Latch-up
Input/Output Capacitance (SDA)
Input Capacitance (SCL, WP)
T
A
= 25°C, f = 1.0 MHz, V
(1)
CC
........... –2.0V to +V
SB
+0.5V, which may overshoot to V
(2)
) = 10µA for the Automotive and Extended Automotive temperature range.
........................ 100mA
CC
CC
= +3.0V)
= +1.8V)
100,000
2000
100
100
CC
CC
= 5V
+ 2.0V
V
CC
–1
x 0.7
CC
+ 2.0V for periods of less than 20ns.
2
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of
the device at these or any other conditions outside of those
listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for
extended periods may affect device performance and
reliability.
Cycles/Byte
8
6
Years
Volts
V
V
mA
CC
CC
0.5
0.4
1
3
3
+ 0.5
x 0.3
1
3
pF
pF
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
mA
mA
µA
µA
µA
V
V
V
V
CC
+1V.
f
V
f
V
V
V
V
V
I
I
SCL
SCL
OL
OL
CC
CC
IN
CC
IN
OUT
= 3.0 mA
= 1.5 mA
= GND or V
= GND to V
=5V
=5V
=5V
= 100 KHz
= 100 KHz
= GND to V
V
V
I/O
IN
= 0V
= 0V
CC
CC
CC