2MBI450U4N-120-50 FUJI ELECTRIC, 2MBI450U4N-120-50 Datasheet - Page 7

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2MBI450U4N-120-50

Manufacturer Part Number
2MBI450U4N-120-50
Description
IGBT, 2 PACK MOD, 1200V, 450A, M254
Manufacturer
FUJI ELECTRIC
Datasheet

Specifications of 2MBI450U4N-120-50

Module Configuration
Dual
Transistor Polarity
N Channel
Dc Collector Current
450A
Collector Emitter Voltage Vces
2.05V
Power Dissipation Max
2.08kW
Collector Emitter Voltage V(br)ceo
1.2kV
Transistor Case Style
Module
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
2MBI450U4N-120-50
Manufacturer:
FUJI
Quantity:
1 000
Part Number:
2MBI450U4N-120-50
Manufacturer:
FUJITSU/富士通
Quantity:
20 000
Company:
Part Number:
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Quantity:
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Test
cate-
gories
14. Reliability test results
1 Terminal Strength
2 Mounting Strength
3 Vibration
4 Shock
5 Solderabitlity
6 Resistance to
1 High Temperature
2 Low Temperature
3 Temperature
4 Unsaturated
5 Temperature
6 Thermal Shock
(Pull test)
Soldering Heat
Storage
Storage
Humidity
Pressurized Vapor
Cycle
Storage
Test items
Pull force
Test time
Screw torque
Test time
Range of frequency : 10 ~ 500Hz
Sweeping time
Acceleration
Sweeping direction : Each X,Y,Z axis
Test time
Maximum acceleration : 5000m/s
Pulse width
Direction
Test time
Solder temp.
Immersion time
Test time
Solder Alloy
within 1~1.5mm from the body.
Solder temp.
Immersion time
Test time
within 1~1.5mm from the body.
Storage temp.
Test duration
Storage temp.
Test duration
Storage temp.
Relative humidity
Test duration
Test temp.
Test humidity
Test duration
Test temp.
Dwell time
Number of cycles
Test temp.
Used liquid : Water with ice and boiling water
Dipping time
Transfer time
Number of cycles
Each terminal should be Immersed in solder
Each terminal should be Immersed in solder
Test methods and conditions
Reliability Test Items
: 20N (Control terminal)
: 10±1 sec.
: 2.5 ~ 3.5 N・m (M5)
: 10±1 sec.
: 15 min.
: 100m/s
: 6 hr. (2hr./direction)
: 1.0msec.
: Each X,Y,Z axis
: 3 times/direction
: 245±5 ℃
: 5±0.5sec.
: 1 time
: Sn-Ag-Cu
: 260±5 ℃
: 10±1sec.
: 1 time
: 125±5 ℃
: 1000hr.
: -40±5 ℃
: 1000hr.
: 85±2 ℃
: 85±5%
: 1000hr.
: 120±2 ℃
: 85±5%
: 96hr.
:
: High ~ RT ~ Low ~ RT
: 100 cycles
:
: 5 min. par each temp.
: 10 sec.
: 10 cycles
40N (Main terminal)
3.5 ~ 4.5 N・m (M6)
1hr. 0.5hr. 1hr. 0.5hr.
High temp. 100
Low temp.
High temp. 125 ±5 ℃
RT
Low temp. -40±5 ℃
2
2
5 ~ 35 ℃
0
-0
+5
+0
-5
MS5F6507
Reference norms
(Aug.-2001 edition)
Test Method 401
Test Method 402
Test Method 403
Condition code B
Test Method 404
Condition code B
Test Method 303
Test Method 302
Condition code A
Test Method 201
Test Method 202
Test Method 103
Test Method 103
Test Method 105
Test Method 307
Condition code A
EIAJ ED-4701
Reference 1
Test code C
Test code E
method Ⅰ
MethodⅠ
methodⅡ
Number
sample
of
H04-004-03a
5
5
5
5
5
5
5
5
5
5
5
5
7
14
Accept-
ance
number
( 0 : 1 )
( 0 : 1 )
( 0 : 1 )
( 0 : 1 )
( 0 : 1 )
( 0 : 1 )
( 0 : 1 )
( 0 : 1 )
( 0 : 1 )
( 0 : 1 )
( 0 : 1 )
( 0 : 1 )
a

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