2MBI200U4B-120-50 FUJI ELECTRIC, 2MBI200U4B-120-50 Datasheet
2MBI200U4B-120-50
Specifications of 2MBI200U4B-120-50
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2MBI200U4B-120-50 Summary of contents
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... SPECIFICATION Device Name : Type Name : Spec. No. : May. 11 ’06 K.Muramatsu T.Miyasaka M.Watanabe May. 11 ’06 K.Yamada IGBT MODULE (RoHS compliant product) 2MBI200U4B-120-50 MS5F6577 MS5F6577 H04-004-07b ...
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Classi- Date Ind. fication May.-11 -’06 Enactment Revised Reliability test a Aug.-09 -’06 Revision Applied Content Drawn date Issued date K.Muramatsu results (P9/14) MS5F6577 Checked Checked ...
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... Outline Drawing ( Unit : Equivalent circuit (RoHS compliant product) 3 MS5F6577 14 H04-004-03a a ...
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Absolute Maximum Ratings ( at Tc= 25 Items Collector-Emitter voltage Gate-Emitter voltage Collector current Collector Power Dissipation Junction temperature Storage temperature Isolation between terminal and copper base (*1) voltage Screw Mounting (*2) Torque Terminals (*2) (*1) All terminals should ...
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... This is the value which is defined mounting on the additional cooling fin with thermal compound. 6. Indication on module Logo of production 2MBI200U4B-120-50 Lot.No. 7. Applicable category This specification is applied to IGBT-Module named 2MBI200U4B-120-50. 8. Storage and transportation notes • The module should be stored at a standard temperature Store modules in a place with few temperature changes in order to avoid condensation on the • ...
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... The document (MS5F6209) about RoHS that Fuji Electric Device Technology issued is applied to this IGBT Module. The Japanese Edition(MS5F6212) is made into a reference grade. ...
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Reliability test results Test cate- Test items gories 1 Terminal Strength Pull force (Pull test) Test time 2 Mounting Strength Screw torque Test time 3 Vibration Range of frequency : 10 ~ 500Hz Sweeping time Acceleration Sweeping direction : ...
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Test cate- Test items gories 1 High temperature Reverse Bias Test temp. Bias Voltage Bias Method Test duration 2 High temperature Bias (for gate) Test temp. Bias Voltage Bias Method Test duration 3 Temperature Humidity Bias Test temp. Relative humidity ...
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Reliability Test Results Test cate- Test items gories 1 Terminal Strength (Pull test) 2 Mounting Strength 3 Vibration 4 Shock 1 High Temperature Storage 2 Low Temperature Storage 3 Temperature Humidity Storage 4 Unsaturated Pressurized Vapor 5 Temperature Cycle 6 ...
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Collector current vs. Collector-Emitter voltage (typ.) o Tj= chip 500 VGE=20V 15V 12V 400 300 200 100 Collector-Emitter voltage : VCE [ V ] Collector current vs. Collector-Emitter voltage (typ.) VGE=15V / chip ...
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Switching time vs. Collector current (typ.) Vcc=600V, VGE=±15V, RG=3.0Ω, Tj=25 10000 1000 toff ton 100 10 0 100 200 Collector current : Switching time vs. Gate resistance (typ.) Vcc=600V, Ic=200A, VGE=±15V, Tj=25 10000 ton 1000 toff ...
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Forward current vs. Forward on voltage (typ.) chip 500 400 o Tj=25 C Tj=125 300 200 100 Forward on voltage : Transient thermal resistance (max.) 1.000 0.100 0.010 0.001 0.001 0.010 0.100 ...
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This product shall be used within its absolute maximum rating (voltage, current, and temperature). This product may be broken in case of using beyond the ratings. 製品の絶対最大定格（電圧，電流，温度等）の範囲内で御使用下さい。絶対最大定格を超えて使用すると、素子が破壊する 場合があります。 - Connect adequate fuse or protector of circuit between three-phase line and ...
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... The application examples described in this specification only explain typical ones that used the Fuji Electric Device Technology products. This specification never ensure to enforce the industrial property and other rights, nor license the enforcement rights. 本 ...