AD9216BCPZ-65 Analog Devices Inc, AD9216BCPZ-65 Datasheet - Page 8

• Manufacturer Part Number: AD9216BCPZ-65
• Description: IC,A/D CONVERTER,DUAL,10-BIT,CMOS,LLCC,64PIN
• Manufacturer: Analog Devices Inc

Specifications of AD9216BCPZ-65

• Number Of Bits: 10
• Sampling Rate (per Second): 65M
• Data Interface: Parallel
• Number Of Converters: 2
• Power Dissipation (max): 240mW
• Voltage Supply Source: Single Supply
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 64-LFCSP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

AD9216
ABSOLUTE MAXIMUM RATINGS
Table 5.
Parameter
ELECTRICAL
AVDD
DRVDD
AGND
AVDD
Digital Outputs
CLK_A, CLK_B, DCS, DFS, MUX_SELECT,
OEB_A, OEB_B, SHARED_REF,
PDWN_A, PDWN_B
VIN−_A, VIN+_A, VIN−_B, VIN+_B
REFT_A, REFB_A,VREF, REFT_B, REFB_B,
SENSE
ENVIRONMENTAL
1
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Typical thermal impedances (64-lead LFCSP); θ
measurements were taken on a 4-layer board (with thermal via array) in still
air, in accordance with EIA/JESD51-7.
Operating Temperature
Junction Temperature
Lead Temperature (10 sec)
Storage Temperature
1
JA
= 26.4°C/W. These
To
AGND
DRGND
DRGND
DRVDD
DRGND
AGND
AGND
AGND
−0.3 V to
+3.9 V
−0.3 V to
+3.9 V
−0.3 V to
+0.3 V
−0.3 V to
+3.9 V
−0.3 V to
DRVDD +
0.3 V
−0.3 V to
AVDD +
0.3 V
−0.3 V to
AVDD +
0.3 V
−0.3 V to
AVDD +
0.3 V
−40°C to
+85°C
150°C
300°C
−65°C to
+150°C
Rating
Rev. A | Page 8 of 40
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or
any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
EXPLANATION OF TEST LEVELS
Table 6.
Test Level
I
II
III
IV
V
VI
Description
100% production tested.
100% production tested at 25°C and sample
tested at specified temperatures.
Sample tested only.
Parameter is guaranteed by design and
characterization testing.
Parameter is a typical value only.
100% production tested at 25°C; guaranteed by
design and characterization testing for industrial
temperature range; 100% production tested at
temperature extremes for military devices.