ADXRS622BBGZ-RL Analog Devices Inc, ADXRS622BBGZ-RL Datasheet - Page 10

• Manufacturer Part Number: ADXRS622BBGZ-RL
• Description: ?250?/sec Yaw Rate Gyroscope
• Manufacturer: Analog Devices Inc

Specifications of ADXRS622BBGZ-RL

• Lead Free Status / RoHS Status: Lead free / RoHS non-compliant

ADXRS622
ADXRS622 AND SUPPLY RATIOMETRICITY
The ADXRS622 RATEOUT and TEMP signals are ratiometric
to the V
temperature outputs are proportional to V
ADXRS622 is most easily used with a supply-ratiometric analog-
to-digital converter (ADC) that results in self-cancellation of errors
due to minor supply variations.
There is some small error due to nonratiometric behavior. Typical
ratiometricity error for null, sensitivity, self-test, and temperature
output is outlined in Table 4.
Note that V
Table 4. Ratiometricity Error for Various Parameters
Parameter
ST1
ST2
Null
Sensitivity
V
TEMP
Mean
Sigma
Mean
Sigma
Mean
Sigma
Mean
Sigma
Mean
Sigma
RATIO
RATIO
voltage, that is, the null voltage, rate sensitivity, and
V
0.3%
0.21%
−0.15%
0.22%
−0.3%
0.2%
0.003%
0.06%
−0.2%
0.05%
must never be greater than AV
S
= V
RATIO
= 4.85 V
RATIO
V
0.09%
0.19%
−0.2%
0.2%
−0.05%
0.08%
−0.25%
0.06%
−0.04%
0.06%
S
. Therefore, the
= V
CC
RATIO
.
= 5.15 V
Rev. C | Page 10 of 12
NULL ADJUSTMENT
The nominal 2.5 V null is for a symmetrical swing range at
RATEOUT (1B, 2A). However, a nonsymmetric output swing
may be suitable in some applications. Null adjustment is possible
by injecting a suitable current to SUMJ (1C, 2C). Note that supply
disturbances may reflect some null instability. Digital supply noise
should be avoided, particularly in this case.
SELF-TEST FUNCTION
The ADXRS622 includes a self-test feature that actuates each of
the sensing structures and associated electronics as if subjected
to angular rate. It is activated by standard logic high levels applied
to Input ST1 (5F, 5G), Input ST2 (4F, 4G), or both. ST1 causes
the voltage at RATEOUT to change about
an opposite change of +0.5 V. The self-test response follows the
viscosity temperature dependence of the package atmosphere,
approximately 0.25%/°C.
Activating both ST1 and ST2 simultaneously is not damaging.
ST1 and ST2 are fairly closely matched (±5%), but actuating
both simultaneously may result in a small apparent null bias
shift proportional to the degree of self-test mismatch.
ST1 and ST2 are activated by applying a voltage equal to V
to the ST1 pin and the ST2 pin. The voltage applied to ST1 and
ST2 must never be greater than AV
CONTINUOUS SELF-TEST
The on-chip integration of the ADXRS622 gives it higher reliability
than is obtainable with any other high volume manufacturing
method. In addition, it is manufactured under a mature BIMOS
process that has field-proven reliability. As an additional failure
detection measure, power-on self-test can be performed.
However, some applications may warrant continuous self-test
while sensing rate. Details outlining continuous self-test
techniques are also available in the
CC
AN-768
.
− 0.5 V, and ST2 causes
Application Note.
RATIO