EPM7512BFI256-7 Altera, EPM7512BFI256-7 Datasheet - Page 27

• Manufacturer Part Number: EPM7512BFI256-7
• Description: MAX 7000/S/AE/B
• Manufacturer: Altera

Specifications of EPM7512BFI256-7

• Family Name: MAX 7000B
• Memory Type: EEPROM
• # Macrocells: 512
• Number Of Usable Gates: 10000
• Frequency (max): 166.67MHz
• Propagation Delay Time: 7.5ns
• Number Of Logic Blocks/elements: 32
• # I/os (max): 212
• Operating Supply Voltage (typ): 2.5V
• In System Programmable: Yes
• Operating Supply Voltage (min): 2.375V
• Operating Supply Voltage (max): 2.625V
• Operating Temp Range: -40C to 85C
• Operating Temperature Classification: Industrial
• Mounting: Surface Mount
• Pin Count: 256
• Package Type: FBGA
• Lead Free Status / Rohs Status: Not Compliant

Power
Sequencing &
Hot-Socketing
Design Security
Generic Testing
Altera Corporation
Because MAX 7000B devices can be used in a mixed-voltage environment,
they have been designed specifically to tolerate any possible power-up
sequence. The V
order.
Signals can be driven into MAX 7000B devices before and during power-
up (and power-down) without damaging the device. Additionally,
MAX 7000B devices do not drive out during power-up. Once operating
conditions are reached, MAX 7000B devices operate as specified by the
user.
MAX 7000B device I/O pins will not source or sink more than 300 µA of
DC current during power-up. All pins can be driven up to 4.1 V during
hot-socketing.
All MAX 7000B devices contain a programmable security bit that controls
access to the data programmed into the device. When this bit is
programmed, a design implemented in the device cannot be copied or
retrieved. This feature provides a high level of design security, because
programmed data within EEPROM cells is invisible. The security bit that
controls this function, as well as all other programmed data, is reset only
when the device is reprogrammed.
MAX 7000B devices are fully functionally tested. Complete testing of each
programmable EEPROM bit and all internal logic elements ensures 100%
programming yield. AC test measurements are taken under conditions
equivalent to those shown in
erased during early stages of the production flow.
CCIO
and V
MAX 7000B Programmable Logic Device Data Sheet
CCINT
Figure
power planes can be powered in any
11. Test patterns can be used and then
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