EVAL-AD5246EBZ Analog Devices Inc, EVAL-AD5246EBZ Datasheet - Page 6

• Manufacturer Part Number: EVAL-AD5246EBZ
• Description: EVALUATION BOARD I.C.
• Manufacturer: Analog Devices Inc

Specifications of EVAL-AD5246EBZ

• Main Purpose: Digital Potentiometer
• Embedded: No
• Utilized Ic / Part: AD5246
• Primary Attributes: 1 Channel, 128 Position
• Secondary Attributes: I²C Interface
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

AD5246
ABSOLUTE MAXIMUM RATINGS
T
Table 4.
Parameter
V
V
Terminal Current, A–B, A–W, B–W
Digital Inputs and Output Voltage to GND
Operating Temperature Range
Maximum Junction Temperature (T
Storage Temperature
Lead Temperature (Soldering, 10 sec)
Thermal Resistance
1
2
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Maximum terminal current is bounded by the maximum current handling of
Package power dissipation = (T
DD
A
A
the switches, maximum power dissipation of the package, and maximum
applied voltage across any two of the A, B, and W terminals at a given
resistance.
, V
Pulsed
Continuous
= 25°C, unless otherwise noted.
to GND
W
to GND
1
3
θ
JA
: SC70-6
JMAX
− T
A
)/θ
JMAX
JA.
)
Value
–0.3 V to +7 V
V
±20 mA
±5 mA
0 V to V
–40°C to +125°C
150°C
–65°C to +150°C
300°C
340°C/W
DD
DD
+ 0.3 V
Rev. B | Page 6 of 16
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.