EVAL-AD5382EBZ Analog Devices Inc, EVAL-AD5382EBZ Datasheet - Page 13

• Manufacturer Part Number: EVAL-AD5382EBZ
• Description: Evaluation Board I.c.
• Manufacturer: Analog Devices Inc

Specifications of EVAL-AD5382EBZ

• Number Of Dac's: 32
• Number Of Bits: 14
• Outputs And Type: 32, Single Ended
• Sampling Rate (per Second): 125k
• Data Interface: DSP, I²C, MICROWIRE™, Parallel, QSPI™, SPI™
• Settling Time: 8µs
• Dac Type: Voltage
• Voltage Supply Source: Single
• Operating Temperature: -40°C ~ 85°C
• Utilized Ic / Part: AD5382
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: Q4391457

ABSOLUTE MAXIMUM RATINGS
T
Table 9.
Parameter
AVDD to AGND
DVDD to DGND
Digital Inputs to DGND
SDA/SCL to DGND
Digital Outputs to DGND
REFIN/REFOUT to AGND
AGND to DGND
VOUTx to AGND
Analog Inputs to AGND
MON_IN Inputs to AGND
MON_OUT to AGND
Operating Temperature Range
Storage Temperature Range
JunctionTemperature (T
100-lead LQFP Package
Reflow Soldering
1
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although
this product features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are
recommended to avoid performance degradation or loss of functionality.
Transient currents of up to 100 mA do not cause SCR latch-up.
A
Commercial (B Version)
θ
Peak Temperature
= 25°C, unless otherwise noted
JA
Thermal Impedance
J
max)
1
.
Rating
–0.3 V to +7 V
–0.3 V to +7 V
–0.3 V to DVDD + 0.3 V
–0.3 V to + 7 V
–0.3 V to DVDD + 0.3 V
–0.3 V to AVDD + 0.3 V
–0.3 V to +0.3 V
–0.3 V to AVDD+ 0.3 V
–0.3 V to AVDD + 0.3 V
–0.3 V to AVDD + 0.3 V
–0.3 V to AVDD + 0.3 V
–40°C to +85°C
–65°C to +150°C
150°C
44°C/W
230°C
Rev. B | Page 13 of 40
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
AD5382