MUR1100EG ON Semiconductor, MUR1100EG Datasheet
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MUR1100EG
Specifications of MUR1100EG
MUR1100EGOS
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MUR1100EG Summary of contents
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... Recommended Operating Conditions may affect device reliability. 1. Pulse Test: Pulse Width = 300 ms, Duty Cycle ≤ 2.0%. *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. © Semiconductor Components Industries, LLC, 2006 1.0 AMPERES, 800− ...
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... ORDERING INFORMATION Device MUR180E MUR180EG MUR180ERL MUR180ERLG MUR1100E MUR1100EG MUR1100ERL MUR1100ERLG †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. *These packages are inherently Pb−Free. MUR180E, MUR1100E Symbol ...
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MUR180E, MUR1100E NOTE 3 — AMBIENT MOUNTING DATA Data shown for thermal resistance, junction−to−ambient (R ) for the mountings shown used as typical qJA guideline values for preliminary engineering or in case the tie point temperature cannot ...
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MUR180E, MUR1100E PACKAGE DIMENSIONS POLARITY INDICATOR OPTIONAL AS NEEDED F (SEE STYLES) K AXIAL LEAD CASE 59−10 ISSUE U NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: INCH. 3. ALL RULES ...