74LVC1GX04GW NXP Semiconductors, 74LVC1GX04GW Datasheet - Page 10

• Manufacturer Part Number: 74LVC1GX04GW
• Manufacturer: NXP Semiconductors

Specifications of 74LVC1GX04GW

• Mounting Style: Surface Mount
• Lead Free Status / RoHS Status: Compliant

Philips Semiconductors
2003 Aug 13
handbook, halfpage
handbook, full pagewidth
X-tal driver
Definitions for test circuit:
R
C
R
f
V
Fig.6
g
i
1.65 to 1.95 V
2.3 to 2.7 V
2.7 V
3.0 to 3.6 V
4.5 to 5.5 V
O
L
L
T
fs
= 1 kHz.
= Load resistor.
= Load capacitance including jig and probe capacitance.
= Termination resistance should be equal to the output impedance Z
is constant.
=
-------- -
V i
V
I
o
V
i
Test set-up for measuring forward
transconductance.
0.47 F
CC
input
R bias = 560 k
V
V
2.7 V
2.7 V
V
CC
CC
CC
V
I
V CC
30 pF
30 pF
50 pF
50 pF
50 pF
output
C
GENERATOR
L
PULSE
100 F
Fig.5 Load circuitry for switching times.
MNA638
1 k
500
500
500
500
A I o
R
L
V I
open
open
open
open
open
t
PLH
V
R T
EXT
/t
o
10
PHL
of the pulse generator.
D.U.T.
V CC
handbook, halfpage
(mA/V)
T
Fig.7
amb
g fs
160
120
V O
80
40
= 25 C.
0
0
Typical forward transconductance as
a function of supply voltage.
C L
1
V EXT
MNA616
R L
R L
2
3
74LVC1GX04
4
Product specification
5
V CC (V)
MNB101
6